Hostname: page-component-7479d7b7d-jwnkl Total loading time: 0 Render date: 2024-07-11T22:25:28.363Z Has data issue: false hasContentIssue false
  • English
  • Français

Microwave Absorption in NaCl Crystals with Various Controlled Defect Conditions

Published online by Cambridge University Press:  15 February 2011

Binshen Meng ,
John Booske ,
Reid Cooper  and
Sam Freeman
Binshen Meng
Affiliation:
Department of Electrical and Computer Engineering, University of Wisconsin, Madison, WI53706
John Booske
Affiliation:
Department of Electrical and Computer Engineering, University of Wisconsin, Madison, WI53706
Reid Cooper
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin, Madison, WI53706
Sam Freeman
Affiliation:
Materials Science Program, Madison, University of Wisconsin, Madison, WI53706
Get access

Abstract

A thorough understanding of fundamental microwave absorption mechanisms in ionic crystalline solids is important for microwave sintering of ceramics, as well as the design of high speed electronic packaging, advanced radomes, etc. Of particular importance to these applications are how the density and type of crystalline defects affect the dominant microwave absorption mechanisms. We have designed experiments to measure microwave absorption in NaCl samples with controlled variations in defect conditions(pure, point defects, dislocations and grain boundaries) at different temperatures (20–400 °C) and frequencies (2–20 GHz). Initial results are reported and discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 347: Symposium O – Microwave Processing of Materials IV , 1994 , 467
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Breckenridge, R.G., Imperfections in Nearly Perfect Crystals, Ed. Shockley, W., Hollomon, J.H., Maurer, R., and Seitz, F. (J. Wiley and Sons, N.Y., 1952), Chap. 8.Google Scholar
2. Breckenridge, R.G., J. Chem. Phys. 16(10), 959 (1948).Google Scholar
3. Breckenridge, R.G., J. Chem Phys. 18(7), 913 (1950).Google Scholar
4. Hooton, I.E. and Jacobs, P.W.M., J. Phys. Chem. Solids 51(10), 1207 (1990);Google Scholar
Hooton, and Jacobs, , Can. J. Chem. 66, 830 (1988).Google Scholar
5. Sparks, M., King, D.F., and Mills, D.L., Phys. Rev. B26, 6987 (1982), and references contained therein.Google Scholar
6. Subbaswamy, K.R. and Mills, D.L., Phys. Rev. B33, 4213 (1986).Google Scholar
7. Gurevich, V.L. and Tagantsev, A.K., Adv. in Phys. 40, 719–767 (1991).Google Scholar
8. Bunget, I. and Popescu, M., Physics of Solid Dielectrics, (Elsevier, Amsterdam, 1984).Google Scholar
9. Kingery, W.D., Bowen, H.K., and Uhlmann, D.R., Introduction to Ceramics (Wiley and Sons, NY, 1976).Google Scholar
10. Birnbaum, B. and Franeau, J., J. Appl. Phys. 20, 817 (1949).Google Scholar
11. Champlin, K.S. and Krongard, R.R., JRE Trans. Microwave Theory and Tech. MTT–9, 545 (1961).Google Scholar
12. Parkash, A., Vaid, J.K., and Mansingh, A., IEEE Trans. Micr. Thy. Tech. MTT–27, 791 (1979).Google Scholar