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Microstructure and Sensing Properties of Cryosol Derived Nanocrystalline Tin Dioxide

Published online by Cambridge University Press:  09 August 2011

S. M. Kudryavtseva ,
A. A. Vertegel ,
S. V. Kalinin ,
L. I. Kheifets ,
J. Van Landuyt ,
L. L. Meshkov ,
S. N. Nesterenko ,
E. S. Rembeza  and
A. M. Gaskov.
S. M. Kudryavtseva
Affiliation:
Department of Chemistry, Moscow State University, 119899, Moscow, Russia
A. A. Vertegel
Affiliation:
Department of Chemistry, Moscow State University, 119899, Moscow, Russia
S. V. Kalinin
Affiliation:
Department of Chemistry, Moscow State University, 119899, Moscow, Russia
L. I. Kheifets
Affiliation:
Department of Chemistry, Moscow State University, 119899, Moscow, Russia
J. Van Landuyt
Affiliation:
EMAT, University of Antwerp, 2020 Antwerp, Belgium
L. L. Meshkov
Affiliation:
Department of Chemistry, Moscow State University, 119899, Moscow, Russia
S. N. Nesterenko
Affiliation:
Department of Chemistry, Moscow State University, 119899, Moscow, Russia
E. S. Rembeza
Affiliation:
EMAT, University of Antwerp, 2020 Antwerp, Belgium
A. M. Gaskov.
Affiliation:
Department of Chemistry, Moscow State University, 119899, Moscow, Russia
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Abstract

The powders of nanocrystalline tin dioxide were prepared by two different methods: conventional hydrolysis of SnCl4 in aqueous solution and novel cryosol technique. The microstructure, composition, and electrical properties of the samples were investigated. The sintered pellets obtained by means of the cryosol method are characterized by significantly higher values of electrical resistance as compared to those prepared by conventional technique. A significant effect of the microstructure on the sensing properties of nanocrystalline SnO2 has been found. The sensitivity to H2S of the samples synthesized by cryosol method was shown to be higher than that of the samples obtained by traditional precipitation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 536: Symposium F – Microcrystalline & Nanocrystalline Semiconductors - 1998 , 1998 , 389
Copyright
Copyright © Materials Research Society 1999

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