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Microstructural Evolution of TiO2 Sol-Gel Thin Films

Published online by Cambridge University Press:  28 February 2011

J.L. Keddie
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
E.P. Giannelis
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
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Abstract

Backscattering spectrometry has been used to determine the density of TiO2 sol-gel films. The density of the as-deposited films relative to that of anatase varies slightly with respect to deposition conditions and is approximately 0.5. Annealing at temperatures as high as 750°C increases the relative density to 0.7 with concomitant decreases in the O:Ti ratio and H content but it does not result in complete densification. Film densities are consistently higher for films annealed under dynamic vacuum compared to those in air.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

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