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Microstructruture of Heteroepitaxially Grown TiO2 Films by Magnetron Sputtering

Published online by Cambridge University Press:  21 March 2011

Makiko Yamagishi ,
Pung Keun Song  and
Yuzo Shigesato
Makiko Yamagishi
Affiliation:
College of Science & Engineering, Aoyama Gakuin University, 6-16-1 Chitosedai, Setagaya-ku, Tokyo 157-8572, Japan
Pung Keun Song
Affiliation:
College of Science & Engineering, Aoyama Gakuin University, 6-16-1 Chitosedai, Setagaya-ku, Tokyo 157-8572, Japan
Yuzo Shigesato
Affiliation:
College of Science & Engineering, Aoyama Gakuin University, 6-16-1 Chitosedai, Setagaya-ku, Tokyo 157-8572, Japan
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Abstract

Titanium dioxide (TiO2) films were deposited on (a) non-alkali glass, (b) MgO (100) and (c) SrTiO3 (100) single crystals by rf reactive magnetron sputtering using a Ti metal target. X-ray diffraction and a pole figure analysis revealed that TiO2 films on the (a) were anatase polycrystals with <101> preferred orientation, whereas heteroepitaxial growth of anatase TiO2 was observed on the (b) and the (c) substrates. FE-SEM analyses on the crystal habit of the firm surfaces showed that the substrate temperature during the deposition (Ts) heavily affected the microstructure and surface morphology of the heteroepitaxially grown films, which could be clearly explained in terms of “Thornton's zone model” or “epitaxial growth model of 2-dimensional ledge or kink modes” considering the normalized Ts by the phase transition temperature from anatase to rutile.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 672: Symposium O – Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures , 2001 , O8.35
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

[1] Watanabe, T., Nakajima, A., Wang, R., Minabe, M., Koizumi, S., Fujishima, A., Hashimoto, K., Thin Solid Films, 351 (1999) 260.Google Scholar
[2] Aoki, T., Maki, K., Tang, Q., Kumagai, Y., Matumoto, S., J. Vac. Sci. Technol. A, 15 (1997) 2485.Google Scholar
[3] Saitou, H., Sunayama, H., Tanaka, N. and Ohshio, S., J. Ceram. Soc. Jpn., 106 (1998) 1051.Google Scholar
[4] Thornton, J. A., Ann. Rev. Mater. Sci. 7 (1977) 239.Google Scholar
[5] Ishizaka, A., Jpn. J. Appl. Phys. 27 (1988) 883.Google Scholar