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Microscopic Model of Metal-Semiconductor Contacts and Semiconductor Heterojunctions

Published online by Cambridge University Press:  26 February 2011

C. Mailhiotand
Affiliation:
Xerox Webster Research Center, 800 Phillips Road, 0U4–38D Webster, NY 14580
C. B. Duke
Affiliation:
Xerox Webster Research Center, 800 Phillips Road, 0U4–38D Webster, NY 14580
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Abstract

A microscopic many-electron model is utilized to calculate the self-consistent one-electron potential in the vicinity of a metal-semiconductor or semiconductor-semiconductor interface. The boundary conditions ensuring thermal, mechanical and electron-transfer equilibrium are imposed explicitly. Numerical calculations predict the validity of Schottky's phenomenological boundary condition for metal-semiconductor contacts and the applicability of the electron affinity rule for semiconductor heterojunctions. The occurrence of interfacial atomic rearrangements and/or chemical reactions is incorporated into the model via the inclusion of charge centers near the interface.

Type
Research Article
Copyright
Copyright © Materials Research Society 1986

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References

REFERENCES

1. Smith, J.R., Phys. Rev. 181, 522 (1969).Google Scholar
2. Duke, C.B. and Mailhiot, C., J. Vac. Sci. Technol. B 3, 1170 (1985).Google Scholar
3. Mailhiot, C. and Duke, C.B., Phys. Rev. B (in press).Google Scholar
4. Hohenberg, P. and Kohn, W., Phys. Rev. 136, B864 (1964);Google Scholar
Kohn, W. and Sham, L.J., Phys. Rev. 140, A1133 (1965).Google Scholar
5. Lang, N.D., Solid State Phys. 28, 225 (1973).Google Scholar
6. Schottky, W., Naturwissenschaften 26, 843 (1938); Z. Phys. 113, 367 (1939).Google Scholar
7. Anderson, R. L., Solid State Electron. 5, 341 (1962).Google Scholar
8. Gupta, S.C. and Preir, H., in Metal-Semiconductor Schottky Barrier Junctions and Their Applications, Sharma, B.L., Ed., (Plenum, New York, 1984), p.199.Google Scholar
9. Zur, A., McGill, T.C. and Smith, D.L., Phys. Rev. B 28, 2060 (1983).Google Scholar
10. Tang, J.Y.F. and Freeouf, J.L., J. Vac. Sci. Technol. B 2, 459 (1984).Google Scholar
11. Williams, R.H., McKinley, A., Hughes, G.J., Montgomery, V. and McGovern, I.T., J. Vac. Sci. Technol. 21, 594 (1982).Google Scholar
12. Hughes, G.J., McKinley, A., Williams, R.H. and McGovern, I.T., J. Phys. C 15, L159 (1982).Google Scholar
13. Daniels, R.R. and Margaritondo, G., J. Vac. Sci. Technol. A 3, 979 (1985).Google Scholar