Hostname: page-component-77c89778f8-gvh9x Total loading time: 0 Render date: 2024-07-18T21:56:33.185Z Has data issue: false hasContentIssue false
  • English
  • Français

Mechanical Reliability of Z5u Multilayer Capacitors*

Published online by Cambridge University Press:  25 February 2011

Kelly D. Mchenry  and
Barry G. Koepke
Kelly D. Mchenry
Affiliation:
Honeywell Ceramics Center, 5121 Winnetka Avenue North, New Hope, MN 55428
Barry G. Koepke
Affiliation:
Honeywell Ceramics Center, 5121 Winnetka Avenue North, New Hope, MN 55428
Get access

Abstract

Dynamic fatigue experiments were performed on Z5U multilayer capacitors in an attempt to correlate microflaw fracture behavior due to intrinsic processing defects within the material with predictions of fracture behavior based on macrocrack fracture mechanics determinations. A direct correlation between microflaw fracture behavior and predictions based upon macrocrack fracture mechanics techniques was not observable due to the wide size range of processing defects. A systematic post-mortem examination of fracture surfaces was used to identify fracture origins and sort individual test specimens into groups with equivalent flaw sizes. The correlation between microflaw and macrocrack fracture behavior became more “sorting” the dynamic fatigue data into groups withm oereq uoibvvailoeunst aflfatwer sizes.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 72: Symposium G – Electronic Packaging Materials Science II , 1986 , 113
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

Work sponsored by the Office of Naval Research

References

1. Thornley, E.B., in Proceedings of Symposium on Capacitor Technology - Applications and Reliability, Feb. 24∓25, 1981, Huntsville, AL, (NASA Publication), p. 93.Google Scholar
2. Pohanka, R.C., Freiman, S.W., Rice, R.W., Ferroelectrics, 28, 337 (1980).Google Scholar
3. Cozzolino, M.J. and Ewell, G.J., IEEE Trans on Components, Hybrids and Manufacturing Technology, Vol. CHMT–3, No. 2 (1980).Google Scholar
4. McHenry, K.D. and Koepke, B.G., ONR Technical Report #1, Contract N00014–83-C0141, May 1985.Google Scholar
5. Freiman, S. W. (private communication).Google Scholar
6. Williams, D.P. and Evans, A.G., J. Testing and Eva., 1, 264 (1973).Google Scholar
7. Wiederhorn, S.M., in Fracture Mechanics of Ceramics, Vol.2, (Plenum Press, New York, 1974), p. 623.Google Scholar