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Mechanical Properties of Composition Modulated Copper-Nickel-Iron Thin Films

Published online by Cambridge University Press:  26 February 2011

A. F. Jankowski  and
T. Tsakalakos
A. F. Jankowski
Affiliation:
ROCKWELL INTERNATIONAL, ROCKY FLATS PLANT, P.O. BOX 464, GOLDEN, CO 80401
T. Tsakalakos
Affiliation:
Dept. of Mechanics and Materials Science, Rutgers University, P.O. Box 909, Piscataway, NJ 08854
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Abstract

The enhanced elastic modulus effect was found in composition modulated Cu/NiFe foils. Young's modulus was measured via tensile testing on thin foils containing short-wavelength composition modulations of 1.4–10. nm. The foils, of 53% Cu -40% Ni -7% Fe composition, were produced by vapor deposition using a three-source evaporator. As compared with homogeneous foils of the same average composition, the modulated foils exhibited an appreciable increase (up to 300%) in modulus for two distinct ranges of compositon wavelength: 2.1–2.7 nm and 3.6–4.1 nm. Results of x-ray diffraction and Mossbauer spectroscopy studies suggest the concept of interfacial coherency, accommodating the lattice misfit between the composition layers, is the underlying structural feature responsible for the enhanced modulus effect.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 37: Symposium D – Layered Structures, Epitaxy, and Interfaces , 1984 , 529
Copyright
Copyright © Materials Research Society 1985

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References

[1] Yang, W. M. C., Tsakalakos, T., and Hilliard, J. E., J. Appl. Phys. 18, 876, (1977).CrossRefGoogle Scholar
[2] Henein, G. E. and Hilliard, J. E., J. Appl. Phys., 54, 728, (1983).CrossRefGoogle Scholar
[3] Tsakalakos, T. and Hilliard, J. E., J. Appl. Phys., 54, 734, (1983).CrossRefGoogle Scholar
[4] Jankowski, A. F., Ph.D. Thesis, Rutgers Univeristy, New Bruswick, NJ (1984).Google Scholar
[5] Baral, D., Ph.D. Thesis, Northwestern Univeristy, Evanston, Illinois (1983).Google Scholar
[6] Mayo, W. E., Liu, H. Y., and Chaudhuri, J., “X-Ray Topographic Methods and Application to Analysis of Electronic Materials”, Proceedings of High Speed Growth and Characterization of Crystals for Solar Cells. July 1983, Port St. Lucie, Florida, U.S.A. Google Scholar
[7] Tsakalakos, T., and Jankowski, A. F., “The Effect of Strain on the Elastic Constants of Copper”, NATO ASI Series on Modulated Structure Materials, Maleme-Chania, Crete, Greece, Nijhoff Publishers (1984).CrossRefGoogle Scholar
[8] Dunaev, N.M. and Zakharova, M. I., JETP Lett., 20, 336, (1974).Google Scholar
[9] Tsakalakos, T., Ph.D., Northwestern University, Evanston, Illinois (1977).Google Scholar
[10] Nanao, S., Kuribayashi, K., Tanigawa, S. and Doyama, M., Phys. Lett. A, 38, 487, (1972).CrossRefGoogle Scholar
[11] Purdes, A., Ph.D. Thesis, Northwestern Univeristy, Evanston, Illinois (1976).Google Scholar
[12] Shinjo, T., Hosoito, N., Kawaguchi, K., Takada, T., Endoh, Y., Ajro, Y., and Friedt, J. M., J. Phys. Soc. Jpm, 52, 3154, (1983).CrossRefGoogle Scholar
[13] Shinjo, T., Lauer, J., and Keune, W., Physica 86–88B, 407, (1977).Google Scholar
[14] Shinjo, T., Hine, S., and Takada, T., J. Phys. Soc, Jpn., 47, 767, (1979).Google Scholar
[15] Shinjo, T., Hosoito, N., and Takada, T., J. Phys. Soc. Jpn., 50, 1903, (1981).Google Scholar