Skip to main content Accessibility help
×
Home

Measurement of the Relative Position of Adjacent Crystals and the Modelling of Interfacial Structure

  • M.H.I. El-Eraki (a1), C.J. Kiely (a1) and R.C. Pond (a1)

Abstract

Various techniques using transmission electron microscopy for determining the relative position of two crystals separated by an interface are reviewed briefly. Measurements obtained by these means can be used to identify unrelaxed interfacial configurations. The modelling of relaxed configurations based on these unrelaxed candidate structures requires additional information from experimental techniques such as electron diffraction and high resolution microscopy, or theoretical investigation by computer simulation. This procedure is illustrated for a selection of grain and interphase boundaries. {211} grain boundaries between twin related crystals of Al and Ge, and interfaces in NiSi2:Si, CoSi2:Si and AI:GaAs epitaxial systems, are discussed.

Copyright

References

Hide All
1. Pond, R.C. and Smith, D.A., Canad. Metall. Q. 13, 33 (1974).
2. Pond, R.C., J. Micros. 116, 105 (1979).
3. Pond, R.C. and Vitek, V., Proc. R. Soc. Lond. A357, 453 (1977).
4. Pond, R.C., Proc. R. Soc. Lond. A357, 471 (1977).
5. Vlachavas, D. and Pond, R.C., Inst. Phys. Conf. Ser. No. 60, 159 (1981).
6. Fontaine, C. and Smith, D.A., Appl. Phys. Lett. 40, 153 (1982).
7. Papon, A.M. and Petit, M., Scripta Met. 19 391 (1985).
8. Rocher, A. and Labidi, M., Revue Phys. Appl. 21, 201 (1986).
9. Komninou, Ph., Karakostas, Th. and Delavignette, P., J. Mat. Sd. 21, 3817 (1980).
10. Papon, A.M., Petit, M. and Bacmann, J.J., Phil. Mag. A49, 573 (1984).
11. Bacmann, J.J., Papon, A.M., Petit, M. and Silvestre, G., Phil. Mag. A51,697 (1985).
12. Matthews, J.W. and Stobbs, W.M., Phil. Mag. A36, 373 (1977).
13. Wood, G.J., Stobbs, W.M. and Smith, D.J., Phil. Mag. A50, 375 (1984).
14. Boothroyd, C.B., Crawley, A.P. and Stobbs, W.M., Phil. Mag. A54, 663 (1986).
15. Gibson, J.M., Ultramicroscopy 14, 11, (1984).
16. Eaglesham, D.J., Kiely, C.J., Cherns, D. and Missous, M., Phil. Mag. A60, 161 (1989).
17. Cherns, D., Kiely, C.J. and Eaglesham, D.J., Proc. Mat. Res. Soc. Symp., 75 321 (1985).
18. Schapink, F.W. and Mertens, F.J.M., Scripta Met. 15, 611 (1981).
19. Caron, R.P. and Schapink, F.W., Ultramicroscopy, 17, 383 (1985).
20. Schapink, F.W., Forghany, S.K.E. and Buxton, B.F., Acta Cryst. A39, 805 (1983).
21. Schapink, F.W., Forghany, S.K.E. and Caron, R.P., Phil. Mag. A53, 717 1986.
22. El-Eraki, M.H.I., Ph.D. Thesis, University of Liverpool (1989).
23. Pond, R.C., in Dislocations in Solids, Vol. 8, edited by Nabarro, F.R.N. (North-Holland, Anmsterdam, 1989) p.1.
24. Bollmann, W., Crystal Defects and Crystalline Interfaces (Springer-Verlag, Berlin, 1970).
25. Pond, R.C., in Grain Boundary Structure and Kinetics, edited by Balluffi, R.W. (ASM, Columbus 1980).
26. Sun, C.P. and Balluffi, R.W., Phi. Mag. A46, 63 (1982).
27. Pond, R.C., Bacon, D.J., Serra, A. and Sutton, A.P., accepted for publication in Metall. Trans. (1990).
28. Bourret, A. and Bacmann, J.J., Inst. Phys. Conf. Ser. No. 78, 337 (1985).
29. Bourret, A., Billard, L. and Petit, M., Inst. Phys. Conf. Ser. No. 76, 23 (1985).
30. Cheikh, M., Hairie, A., Hairie, F., Nouet, G. and Paumier, E., accepted for publication in J. Phys. Colloq. (1990).
31. Bourret, A. and Bacmann, J.J., Proc. J.I.M.I.S. 4, Minakami Spu (1985).
32. Paxton, A.T. and Sutton, A.P., J. Phys. C 21 L481 (1988).
33. Cherns, D., Anstis, G.R., Hutchison, J.L. and Spence, J.C.H., Phil. Mag. A 46, 849 (1982).
34. Batstone, J.L., Gibson, J.M., Tung, R.T. and Loretto, D., EMSA Proceedings, (1989).
35. Loretto, D., Gibson, J.M., White, A.E., Short, K.T., Tung, R.T., Yahsave, S.M. and Batstone, J.L., Appl. Phys. Letts. - in press (1989).
36. Kiely, C.J. and Cherns, D., Phil. Mag. A. 59 (1), 1, (1989).

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed