Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-17T21:27:31.688Z Has data issue: false hasContentIssue false
  • English
  • Français

Measurement of Strain Associated with Defects in SiTiO3 Bicrystals using Near-Field Scanning Optical Microscopy

Published online by Cambridge University Press:  15 February 2011

E. B. McDaniel  and
J. W. P. Hsu
E. B. McDaniel
Affiliation:
Dept. of Physics, Univ. of Virginia, Charlottesville, VA 22903
J. W. P. Hsu
Affiliation:
Dept. of Physics, Univ. of Virginia, Charlottesville, VA 22903
Get access

Abstract

We incorporate a polarization modulation technique in a near-field scanning optical microscope (NSOM) for quantitative polarimetry studies at the nanometer scale. Using this technique, we map out stress-induced birefringence associated with submicron defects at the fusion boundaries of SiTiO3 bicrystals. The strain fields surrounding these defects are larger than the defect sizes and show complex spiral shapes that break the reflection symmetry of the bicrystal boundary.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 474: Symposium L – Epitaxial Oxide Thin Films III , 1997 , 131
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. McDaniel, E. B., Gausepohl, S. C., Li, C-T., Lee, Mark, Hsu, J. W. P., Rao, R. A., and Eom, C. B., Appl. Phys. Lett. (04/07/97 issue)Google Scholar
2 Nikko Hitech Inc.Google Scholar
3. Betzig, E., Trautman, J. K., Harris, T. D., Weiner, J. S., Kostelak, R. L., Science 251, 1468 (1991)Google Scholar
4 Hsu, J. W. P., Lee, Mark, and Deaver, B. S., Rev. Sei. Instrum. 66, 3177 (1995);Google Scholar
Lee, Mark, McDaniel, E. B., and Hsu, J. W. P., Rev. Sei. Instrum. 67, 1468 (1996)Google Scholar
5 McDaniel, E. B. and Hsu, J. W. P., J. Appl. Phys. 80, 1085 (1996)Google Scholar
6 Gupta, V. K. and Kornfield, J. A., Rev. Sei. Instrum. 65, 2823 (1994)Google Scholar
7 Oakberg, T., Linear Birefringence and Optical Rotation, Hinds Instruments Application Note (1993)Google Scholar
8 McDaniel, E. B. and Hsu, J. W. P., J. Appl. Phys. 81, (1997)Google Scholar
9 Nye, J. F., Physical Properties of Crystals (Clarendon, Oxford, 1985), chapter XIII.2Google Scholar
10 Gervais, F., in Handbook of Optical Constants of Solids II, edited by Palik, E. D. (Academic, Boston, 1991)Google Scholar
11 Reintjes, J. and Schulz, M. B., J. Appl. Phys. 39, 5254 (1968)Google Scholar
12 Weertman, J. and Weertman, J. R., Elementary Dislocation Theory (Oxford, New York, 1992), chapter 2Google Scholar
13 Szot, K., Speier, W., Herion, J., and Freiburg, Ch., Appl. Phys. A. 64, 55 (1997)Google Scholar