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Measurement of Grain Boundary Migration In Situ by Synchrotron X-Ray Topography

Published online by Cambridge University Press:  26 February 2011

C. L. Bauer ,
J. Gastaldi ,
C. Jourdan  and
G. Grange
C. L. Bauer
Affiliation:
Carnegie Mellon University Pittsburgh, PA 15213, USA
J. Gastaldi
Affiliation:
Centre de Recherche sur les Mecanismes de la Croissance Cristalline 13288 Marseille Cedex 9, France
C. Jourdan
Affiliation:
Centre de Recherche sur les Mecanismes de la Croissance Cristalline 13288 Marseille Cedex 9, France
G. Grange
Affiliation:
Centre de Recherche sur les Mecanismes de la Croissance Cristalline 13288 Marseille Cedex 9, France
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Abstract

Kinetics of grain boundary migration have been investigated in prestrained monocrystalline specimens of aluminum in situ at temperatures ranging from 415 to 610° C by synchrotron (polychromatic) x-ray topography (SXRT). In general, new (recrystallized) grains, which nucleate at prepositioned surface indentations and subsequently grow into the prestrained matrix, transform progressively from random to faceted configurations. Analysis of corresponding migration rates as a function of temperature for several faceted boundaries yields activation energies ranging from about 56 to 105 kcal/mole, in contrast to previously reported values, obtained by repetitive cooling and reheating cycles, ranging from about 15 to 35 kcal/mole. This disparity in measured activation energy is attributed to variation of grain boundary mobility with grain boundary inclination, and ultimate survival of low-mobility (faceted) grain boundary inclinations, as a natural consequence of growth selection.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 122: Symposium I – Interfacial Structure, Properties, and Design , 1988 , 199
Copyright
Copyright © Materials Research Society 1988

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References

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