Skip to main content Accessibility help

The mean inner potential of GaN measured from nanowires using off-axis electron holography

  • Andrew See Weng Wong (a1), Ghim Wei Ho (a2), Rafal E Dunin-Borkowski (a3), Takeshi Kasama (a4), Rachel A Oliver (a5), Pedro MFJ Costa (a6) and Colin John Humphreys (a7)...


The mean inner potentials of wurtzite GaN nanowires are measured using off-axis electron holography in the transmission electron microscope (TEM). The nanowires have a circular cross-section and are suspended across holes in a holey carbon film, resulting in an accurate knowledge of their thickness profiles and orientations. They are also free of the implantation and damage that is present in mechanically-polished ion-milled TEM specimens. The effect of a thin amorphous coating, which is present on the surfaces of the nanowires, on measurements of their mean inner potential is assessed. A value for the mean inner potential of GaN of (16.7 ± 0.3) V is obtained from these samples.



Hide All
1. Dunin-Borkowski, R.E., McCartney, M.R., Smith, D.J., Electron holography of nanostructured materials in: Nalwa, H.S. (Ed.), Encyclopaedia of Nanoscience and Nanotechnology, Vol 3, American Scientific Publishers, Stevenson Ranch, CA, (2004).
2. Tonomura, A., Allard, L.F., Pozzi, G., Joy, D.C. and Ono, Y.A. (Eds.), Electron holography, Elsevier, Amsterdam, (1995).
3. Völkl, E., Allard, L.F. and Joy, D.C. (Eds.), Introduction to Electron Holography, Plenum, New York, (1998).
4. Takeguchi, M., McCartney, M.R. and Smith, D.J., Appl. Phys. Lett. 84, 2103 (2004).
10. Stevens, M., Bell, A., McCartney, M.R., Ponce, F.A., Marui, H. and Tanaka, S., Appl. Phys. Lett. 85, 4651 (2004).
5. Li, J., McCartney, M.R., Dunin-Borkowshi, R.E., and Smith, D.J., Acta Cryst. A 55, 652 (1999).
6. Gajdardziska-Josifovska, M., McCartney, M.R., de Ruijter, W.J., Smith, D.J., Weiss, J.K. and Zuo, J.M., Ultramicroscopy 50, 285 (1993).
7. McCartney, M.R., Gribelyuk, M.A., Li, J., Rosheim, P., McMurray, J.S. and Smith, D.J., Appl. Phys. Lett. 80, 3213 (2002).
8. Dunin-Borkowski, R.E., Newcomb, S.B., Kasama, T., McCartney, M.R., Weyland, M. and Midgley, P.A., Ultamicroscopy 103, 67 (2005).
9. Barnard, J.S., Kappers, M.J., Thrush, E.J. and Humphreys, C.J., in Microscopy of Semiconducting Materials 2003, Inst. of Physics, Bristol and Philadelphia, 281 (2003).



Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed