Skip to main content Accessibility help
×
Home

Making, Breaking and Sliding of Nanometer-Scale Contacts

  • R.W. Carpick (a1), M. Enachescu (a1), D.F. Ogletree (a1) and M. Salmeron (a1)

Abstract

The contact between an atomic force microscope tip and a sample surface can form an ideal single asperity of nanometer dimensions, where the interaction forces can be measured with sub- nanoNewton force resolution. Studies of contact, adhesion and friction for these nano-asperities have been carried out for a variety of tips and single crystal sample surfaces. The major result is the observation of proportionality between friction and true contact area for a variety of systems, and an impressive agreement with continuum mechanics models for contact area even at the nanometer scale. The relevant continuum models can in fact be understood in the framework of fracture mechanics.

Copyright

References

Hide All
1. Carpick, R.W. and Salmeron, M., Chem. Rev. 97, 1163 (1997).
2. Ogletree, D.F., Carpick, R.W., and Salmeron, M., Rev. Sci. Instrum. 67, 3298 (1996).
3. Dai, Q., Völlmer, R., Carpick, R.W., Ogletree, D.F., and Salmeron, M., Rev. Sci. Instrum. 66, 5266 (1995).
4. Carpick, R.W., Agrait, N., Ogletree, D.F., and Salmeron, M., J. Vac. Sci. Technol. B 14, 1289 (1996).
5. Sheiko, S.S., Möller, M., Reuvekamp, E.M.C.M., and Zandbergen, H.W., Phys. Rev. B 48, 5675 (1993).
6. Carpick, R.W., Agraft, N., Ogletree, D.F., and Salmeron, M., Langmuir 12, 3334 (1996).
7. Enachescu, M., van den Oetelaar, R.J.A., Carpick, R.W., Ogletree, D.F., Flipse, C.F.J., and Salmeron, M., Phys. Rev. Lett. 81, 1877 (1998).
8. van den Oetelaar, R. and Flipse, C., Surf. Sci. 384, L828 (1997).
9. Morita, S., Fujisawa, S., and Sugawara, Y., Surf. Sci. Rep. 23, 3 (1996).
10. Johnson, K.L., Kendall, K., and Roberts, A.D., Proc. Roy. Soc. London A 324, 301 (1971).
11. Johnson, K.L., Proc. Roy. Soc. London A 453, 163 (1997).
12. Maugis, D. and Barquins, M., J. Phys. D. (Appl. Phys.) 11, 1989 (1978).
13. McNeil, L.E. and Grimsditch, M., J. Phys: Condens. Matter 5, 1681 (1992).
14. Metals Handbook, 10th ed. American Society for Metals, Metals Park, Ohio, 1990.
15. Cottrell, A.H., Introduction to the Modern Theory of Metals, Institute of Metals, London Brookfield, VT, USA, 1988.
16. Hurtado, J. and Kim, K.-S., Proc. Roy. Soc. A under review (1999).
17. Hurtado, J. and Kim, K.-S., Fracture and Ductile vs. Brittle Behavior – Theory, Modeling and Experiment; Proceedings of MRS Fall Meeting Symposium M, December 1998, Boston, MA. this volume (1999).
18. Briscoe, B.J. and Evans, D.C.B., Proc. Roy. Soc. London A 380, 389 (1982).
19. Singer, I.L., Bolster, R.N., Wegand, J., Fayeulle, S., and Stupp, B.C., Appl. Phys. Lett. 57, 995 (1990).
20. Johnson, K.L., Langmuir 12, 4510 (1996).
21. Greenwood, J.A., Proc. Roy. Soc. London A 453, 1277 (1997).
22. Maugis, D., J. Colloid Interface Sci. 150, 243 (1992).
23. Derjaguin, B.V., Muller, V.M., and Toporov, Y.P., J. Colloid Interface Sci. 53, 314 (1975).
24. Carpick, R.W., Ogletree, D.F., and Salmeron, M., J. Colloid Interface Sci. under review (1998).
25. Johnson, K.L., Contact Mechanics, University Press, Cambridge, 1987.
26. Tortonese, Dr. M., Park Scientific Instruments Inc., Sunnyvale, CA (personal communication).
27. Sze, S.M., Physics of Semiconductor Devices, 2nd ed. Wiley, New York, 1981.
28. Klein, C.A., Materials Research Bulletin 27, 1407 (1992).
29. Shackelford, J.F., Alexander, W., and Park, J.S., CRC Materials Science and Engineering Handbook, 2nd ed. CRC Press, Boca Raton, 1994.
30. van den Oetelaar, R.J.A., Ph.D. Thesis, Eindhoven University of Technology, 1998.
31. Carpick, R.W., Dai, Q., Ogletree, D.F., and Salmeron, M., Trib. Lett. 5, 91 (1998).
32. Barrena-Villas, E., Kopta, S., Ogletree, D.F., Charych, D.H., and Salmeron, M., Phys. Rev. Lett. under review (1998).

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed