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Magnetic Structure of Multilayers from Soft-X-Ray Magnetic Circular Dichroism

Published online by Cambridge University Press:  15 February 2011

C. T. Chen ,
Y. U. Idzerda ,
C.-C. Kao ,
L. H. Tjeng ,
H.-J. Lin  and
G. Meigs
C. T. Chen
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
Y. U. Idzerda
Affiliation:
Naval Research Laboratory, Washington, D. C. 20375
C.-C. Kao
Affiliation:
National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973
L. H. Tjeng
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
H.-J. Lin
Affiliation:
AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974
G. Meigs
Affiliation:
National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973
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Abstract

Soft-x-ray magnetic circular dichroism (MCD) is the difference between the absorptivity or reflectivity of left and right circularly polarized soft-x-rays at the magnetically interesting L2,3- edges of 3d transition metals or the M4,5-edges of the 4f rare earth elements. Thanks to its large absorption cross-section and strong MCD effect, this technique has become a powerful new means for probing, in an element- and site-specific manner, the magnetic properties of ultra-thin films and multilayers. Soft-x-ray MCD experiments, recently conducted at the Dragon beamline, are utilized to demonstrate the recent progress in this technique and its applications in the research of magnetic thin films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 375: Symposia AA – Applications of Synchrotron Radiation Techniques to Materials Science , 1994 , 59
Copyright
Copyright © Materials Research Society 1995

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