Hostname: page-component-8448b6f56d-tj2md Total loading time: 0 Render date: 2024-04-18T22:50:27.711Z Has data issue: false hasContentIssue false

Low-Voltage Cathodoluminescent Properties of Blue-Emitting Yttrium Silicates Doped With Cerium

Published online by Cambridge University Press:  10 February 2011

E. J. Bosze
Affiliation:
Department of Applied Mechanics and Engineering Sciences and Materials Science Program, University of California at San Diego, La Jolla, CA, 92093-0418, ebosze@ucsd.edu
G. A. Hirata
Affiliation:
Department of Applied Mechanics and Engineering Sciences and Materials Science Program, University of California at San Diego, La Jolla, CA, 92093-0418, ebosze@ucsd.edu
J. Mckittrick
Affiliation:
Department of Applied Mechanics and Engineering Sciences and Materials Science Program, University of California at San Diego, La Jolla, CA, 92093-0418, ebosze@ucsd.edu
L. E. Shea
Affiliation:
Sandia National Laboratory, Albuquerque, NM 87185
Get access

Abstract

Yttrium silicate activated with Ce3+, (Y1−xCex)2SiO5, has been found to be an efficient phosphor that can potentially be used as the blue-emitting component in field emission flat panel displays. This highly refractory powder can be synthesized by combustion synthesis, a low cost technique used to fabricate multicomponent oxide powders in a single step process. The effect of activator concentration and post-synthesis annealing was examined on the fluorescent properties. The powders were found to be monoclinic space group P21/c in the as-synthesized state, and transformed to monoclinic space group C2/c after annealing. The maximum luminous emission intensity was reached after a one hour anneal at 1350°C for x=0.0075, with the peak Ce3+ emission wavelength between 420 and 450 nm. When co-doped with Gd3+, no increase in the emission intensity was observed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Chakhovskoi, A.G., Kesling, W.D., Trujillo, J.T. and Hunt, C. E., J. Vac. Sci. Technol. B, 12 (2), p. 785–89 (1994).Google Scholar
2. Holloway, P. H., Sebastian, J., Trottier, T., Jones, S., Swart, H. and Petersen, R.O., Degradation Mechanisms and Vacuum Requirements for FED Phosphors, edited by Hatalis, M., Kanicki, J., Summers, C., and Funada, F. (Mater. Res. Soc. Proc., 424, Pittsburgh, PA, 1996) p. 425–31.Google Scholar
3. Shmulovish, J., Berkstresser, G.W., Brandle, C.D., and Valentino, A., J. Electrochem. Soc., Solid-State Science and Technology, 135, 3141–51 (1988).Google Scholar
4. Ouyang, X., Kitai, A.H. and Xiao, T., J. Appl. Phys., 79 [6], 32293234 (1996).Google Scholar
5. Ouyang, X., Kitai, A.H., Siegele, R., Thin Solid Films, 254, 268–72 (1995).Google Scholar
6. Meiss, D. and Kemmler-Sack, S., Mat. Chem. and Phys., 35, 114–19 (1993).Google Scholar
7. Gomes de Mesquita, A.H. and Bril, A., Mat. Res. Bull., 4, 643–50 (1969).Google Scholar
8. Blasse, G. and Grabmaier, B.C., Luminescent Materials, (Springer-Verlag, New York, 1994), p. 95.Google Scholar
9. Kingsley, J.J. and Patil, K.C., Mat. Letters, 6 [11.12], 427–32 (1988).Google Scholar
10. Shea, L. E., McKittrick, J., Lopez, O.A., J. Am. Ceram. Soc., 79 [12], 3257–65 (1996).Google Scholar
11. Shea, L.E., McKittrick, J., Lopez, O.A., Sluzky, E., Phillips, M.L.F., J. Soc. Info. Display, 5 [2], 117–25 (1997)Google Scholar
12. Phillips, M.L.F., Shea, L.E., (Edited by: Martinez, R.J., Arris, H., Emerson, J.A., Pike, G.) 27th International SAMPE Technical Conference, 501-6, (1995).Google Scholar
13. Zhang, Y. and Stangle, G. C., J. Mater. Res., 9 [8], 19972004 (1994).Google Scholar
14. Cullity, B.D., Elements of X-ray Diffraction, (Addison-Wesley, Mass. 1978),. p. 284.Google Scholar
15. Nassau, K., The Physics and Chemistry of Color: The Fifteen Causes of Color, (John Wiley and Sons, New York, 1983), p. 51.Google Scholar
16. Joint Committee on Powder Diffraction Standards: International Centre for Diffraction Data (ICDD), 12 Campus Blvd., Newtown Square, PA 19073-3273Google Scholar
17. McMurdie, H., Powder Diff, 1 [1], 99 (1986).Google Scholar