Hostname: page-component-8448b6f56d-mp689 Total loading time: 0 Render date: 2024-04-24T07:09:42.381Z Has data issue: false hasContentIssue false
  • English
  • Français

Low Energy Electron Microscopy

Published online by Cambridge University Press:  21 February 2011

R. M. Tromp  and
M. C. Reuter
R. M. Tromp
Affiliation:
IBM Research Division, T.J. Watson Research Center P.O. Box 218 Yorktown Heights, NY 10598, USA
M. C. Reuter
Affiliation:
IBM Research Division, T.J. Watson Research Center P.O. Box 218 Yorktown Heights, NY 10598, USA
Get access

Abstract

- We have designed and built a Low Energy Electron Microscope for surface and interface studies in Ultra High Vacuum. In this paper we present major features of the design, and some of our results on surfactant mediated Ge growth on Si(001).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 237: Symposium Ca – Interface Dynamics and Growth , 1991 , 349
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Binnig, G., Rohrer, H., Gerber, Ch., Weibel, E., Phys. Rev. Lett. 49, 57 (1982).Google Scholar
2. Kahata, H., Yagi, K., Surf. Sci. 220, 131 (1989).Google Scholar
3. Kajiyama, K., Tanishiro, Y., Takayanagi, K., Surf. Sci. 222, 38 (1989).Google Scholar
4. Jones, G.W., Marcano, J.M., Norskov, J.K., Venables, J.A., Phys. Rev. Lett. 65, 3317(1990).Google Scholar
5. Bauer, E., Ultramicroscopy 17, 51 (1985); andGoogle Scholar
Telieps, W. and Bauer, E., Ultramicroscopy 17, 57 (1985).Google Scholar
6. Bauer, E., Mundschau, M., Swiech, W., Telieps, W., J. Vac. Sci. Technol. A9, 1007 (1991).Google Scholar
7. Ruska, E., Z. Phys. 83, 492 (1933).Google Scholar
8. Bruche, E., Z. Phys. 86, 448 (1933).Google Scholar
9. Tromp, R.M. and Reuter, M.C., Ultramicroscopy 36, 99 (1991).Google Scholar
10. Engel, W., Thesis, Berlin 1968.Google Scholar
11. Munro, E., in “Image Processing and Computer-Aided Design in Electron Opties”, Hawkes, P.W. ed., Academie Press, New York, 1973, p. 284.Google Scholar
12. Jakubith, S., Rotermund, H.H., Engel, W., von Oertzen, A., Erti, G., Phys. Rev. Lett. 65, 3013 (1990).Google Scholar
13. Telieps, W. and Bauer, E., Surf. Sci. 162, 163 (1985); and Ber. Bunsenges. Phys. Chem. 90, 197 (1986).Google Scholar
14. Tromp, R.M. and Reuter, M.C., to be publishedGoogle Scholar
15. Tromp, R.M. and Reuter, M.C., to be publishedGoogle Scholar
16. Marce, P.M., Nakagawa, K., Mulders, F.M., van der Veen, J.F., Surf. Sci. 191, 305 (1987).Google Scholar
17. Copel, M., Reuter, M.C., Kaxiras, E., Tromp, R.M., Phys. Rev. Lett. 63, 632 (1989).Google Scholar
18. Horn-Von Hoegen, M., LeGoues, F.K., Copel, M.W., Reuter, M.C., Tromp, R.M., Phys. Rev. Lett. 67, 1130 (1991).Google Scholar
19. Copel, M. and Tromp, R.M., Appl. Phys. Lett. 58, 2648 (1991).Google Scholar