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Long-Term Degradation Mechanism of Organic Light Emitting Devices Based on Small Molecules

Published online by Cambridge University Press:  10 February 2011

Hany Aziz ,
Zoran D. Popovic ,
Nan-Xing Hu ,
Ah-Mee Hor  and
Gu Xu
Hany Aziz
Affiliation:
Department of Materials Science & Engineering, McMaster University, Hamilton, Ontario, Canada, L8S 4L7, azizhm@mcmaster.ca
Zoran D. Popovic
Affiliation:
Xerox Research Centre of Canada, Mississauga, Ontario, Canada, L5K 2L1
Nan-Xing Hu
Affiliation:
Xerox Research Centre of Canada, Mississauga, Ontario, Canada, L5K 2L1
Ah-Mee Hor
Affiliation:
Xerox Research Centre of Canada, Mississauga, Ontario, Canada, L5K 2L1
Gu Xu
Affiliation:
Department of Materials Science & Engineering, McMaster University, Hamilton, Ontario, Canada, L8S 4L7
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Abstract

The intrinsic degradation of tris(8-hydroxyquinoline) aluminum (AlQ3)-based organic light emitting devices, that leads to the long-term decrease in the electroluminescence efficiency of the devices operated under constant current conditions, is studied. The injection of holes in A1Q3 is found to be the main factor responsible for device degradation. OLEDs with dual HTLs in different arrangements are also presented to demonstrate the proposed degradation mechanism. The role of various approaches to increase OLED lifetime, such as, doping the hole transport layer, introducing a buffer layer at the hole-injecting contact, or using a mixed emitting layer of hole and electron transporting molecules, is explained.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 558: Symposium B – Flat-Panel Displays and Sensors-Principles, Materials… , 1999 , 507
Copyright
Copyright © Materials Research Society 2000

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References

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