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Linear measurements of nanomechanical phenomena using small-amplitude AFM

Published online by Cambridge University Press:  01 February 2011

Peter M. Hoffmann ,
Shivprasad Patil ,
George Matei ,
Atay Tanulku ,
Ralph Grimble ,
Özgur Özer ,
Steve Jeffery ,
Ahmet Oral  and
John Pethica
Peter M. Hoffmann
Affiliation:
Department of Physics, Wayne State University, Detroit MI 48201
Shivprasad Patil
Affiliation:
Department of Physics, Wayne State University, Detroit MI 48201
George Matei
Affiliation:
Department of Physics, Wayne State University, Detroit MI 48201
Atay Tanulku
Affiliation:
Department of Physics, Wayne State University, Detroit MI 48201
Ralph Grimble
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Özgur Özer
Affiliation:
Department of Physics, Trinity College, Dublin, Ireland
Steve Jeffery
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Ahmet Oral
Affiliation:
Department of Physics, Bilkent University, Ankara, Turkey
John Pethica
Affiliation:
Department of Physics, Trinity College, Dublin, Ireland
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Abstract

Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 838: Symposium O – Scanning Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials , 2004 , O1.8
Copyright
Copyright © Materials Research Society 2005

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