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Light-Response Characteristics of Amorphous Silicon Arrays for Megavoltage and Diagnostic Imaging

Published online by Cambridge University Press:  21 February 2011

L. E. Antonuk ,
J. Yorkston ,
C. W. Kim ,
W. Huang ,
E. J. Morton ,
M. J. Longo  and
R. A. Street
L. E. Antonuk
Affiliation:
Department of Radiation Oncology, University of Michigan, Ann Arbor, MI 48109
J. Yorkston
Affiliation:
Department of Radiation Oncology, University of Michigan, Ann Arbor, MI 48109
C. W. Kim
Affiliation:
Department of Radiation Oncology, University of Michigan, Ann Arbor, MI 48109
W. Huang
Affiliation:
Department of Radiation Oncology, University of Michigan, Ann Arbor, MI 48109
E. J. Morton
Affiliation:
Department of Radiation Oncology, University of Michigan, Ann Arbor, MI 48109
M. J. Longo
Affiliation:
Department of Physics, University of Michigan, Ann Arbor, MI 48109
R. A. Street
Affiliation:
Xerox Palo Alto Research Center, Palo Alto, CA 94304
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Abstract

Light-sensitive hydrogenated amorphous silicon pixel arrays are now under development for real-time megavoltage and diagnostic fluoroscopic imaging. Such applications place stringent demands upon a variety of array properties including the uniformity of the light-response function of the pixels. It is desirable that the design and fabrication of these imaging arrays maximize such uniformity. The implications of uniformity for imaging are reviewed, and data obtained from small arrays are presented and discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 219: Symposium A – Amorphous Silicon Technology - 1991 , 1991 , 531
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

[1] Antonuk, L.E., et al.: “Large area amorphous silicon photodiode arrays for radiotherapy and diagnostic imaging.” Accepted for publication in Nucl. Instr. and Meth., 1991.Google Scholar
[2] Antonuk, L.E., et al.: “Signal, noise, and readout considerations in the development of amorphous silicon photodiode arrays for radiotherapy and diagnostic x-ray imaging”. Accepted for publication in proceedings of the SPIE Conference “Medical Imaging V”, San Jose, CA (1991).Google Scholar
[3] Street, R.A., et al., Material Research Society Proc. 192, 441 (1990).Google Scholar