Skip to main content Accessibility help

Lead Scandium Tantalate Thin Films for Thermal Detectors

  • A. Patel (a1), N.M. Shorrocks (a1) and R.W. Whatmore (a1)


Thin films of lead scandium tantalate (Pb(Sc½Ta½)03) (PST) have been prepared by a novel modified sol-gel process. The process involves two deposition steps. In the first, layers of amorphous ScTaO4 are deposited by spin coating a solution of metallorganic compounds of scandium and tantalum. A film of lead oxide is then deposited onto the surface using a solution of lead acetate, and the process repeated to obtain thicker films. After firing the composite film, a pale yellow transparent film of PST is obtained. The films are highly orientated and 100% perovskite.

The film's electrical properties have been measured against field and temperature, showing a strong induced pyroelectric response (peak value of 3.8 x 10−3C/m2K), peak permittivities of 4500 and low loss. The figure-ofmerit of these films (11 x 10−5Pa−½) indicates a performance equivalent to conventional bulk ceramic pyroelectric wafers prepared by slicing, lapping and polishing of ceramic blocks.



Hide All
1. Watton, R. and Todd, M.A., ‘Electroceramics’, Institute of Ceramics Conference, British Ceramics Proceedings, Vol 41, 205, February 1989, The Institute of Ceramics, Stoke-on-Trent, UK.
2. Okuyama, M., Seto, H., Kojima, M., Matsui, Y. and Hamakawa, Y.., Jap. J. Appl. Phys., 22, Supplement 22-1, 465, (1983).
3. Whatmore, R. W., Rep. Prog. Phys., 49, 1335, (1986).
4. Whatmore, R.W., Osbond, P.C. and Shorrocks, N.M., Ferroelectrics, 76, 351, (1987).
5. Stenger, C.G.F. and Burggraaf, A.J., Phys. Status. Solidi. (a), 61, 653, (1980).
6. Oikawa, M. and Toda, H., Appl. Phys. Lett., 29, 491, (1976).
7. Francombe, M.H. and Krishnaswany, S.V., J. Va. Sci. Technol. A, 8 (3), 1382 (1990).
8. Castellano, R.N. and Feinstein, L.G., J. Appl. Phys., 50, 4406, (1979).
9. Ainger, F.W., Brierley, C.J., Hudson, M.D., Trundle, C. and Whatmore, R.W., Ferroelectric Thin Films, Eds. Myers, E.R., Kingdon, A.I., (Mater. Res. Soc. Proc. 200, San Francisco, CA. (1990).
10. Okuwada, K., Nakamura, S., Imai, M. and Kakunmo, K., Jap. J. Appl. Phys., 29 (6), 1153 (1990).
11. Shrout, I.R. and Halliyal, A., Am. Ceram. Soc. Bull., 66 (4), 704 (1987).
12. Ramamurthi, S.D. and Payne, D.A., Mat. Res. Soc. Symp. Proc., 180, 73, (1990).
13. Morgan, G.T. and Moss, H.W., J. Chem. Soc., 189 (1914).
14. Randall, C.A., Barber, D.J., Whatmore, R.W. and Groves, P., J. Mats. Sci., 21, 4456, (1986).
15. Wang, H. and Schulze, W.A., J. Am. Ceram. Soc., 73 (5), 1228 (1990).
16. Reaney, I.M. and Barber, D.J., ‘Transmission Elec-Tron Microscopy of Lead Scandium Tantalate Thin Films’, submitted to the J. Microscopy.
17. Beech, F., Jordan, W. Michaela, Catlow, C.R.A, Santoro, A. and Steele, B.C.H., J. Solid State Chem., 77, 322, (1988).
18. Smolenskii, G.A., Jap. J. Appl. Phys.,28 supple., 26 (1970).
19. Tohge, N., Takahashi, S. and Minami, T., J. Am. Ceram. Soc., 74 (1), 67 (1991).
20. Bhalla, A.S., Fang, C.S. and Cross, L.E., Mats. Letts., 3, 475, (1985).
21. Neurgasnkar, R.R., Cory, W.K. and Oliver, J.R., Ferroelectrics, 51, 3, (1983).
22. Shorrocks, N.M., Whatmore, R.W. and Osbond, P.C., Ferroelectrics, 106, 387, (1990).

Lead Scandium Tantalate Thin Films for Thermal Detectors

  • A. Patel (a1), N.M. Shorrocks (a1) and R.W. Whatmore (a1)


Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed