Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-23T20:00:37.523Z Has data issue: false hasContentIssue false

Laser-Induced Formation of Thin TiO2 Films from TiC14 and Oxygen an a Silicon Surface.

Published online by Cambridge University Press:  28 February 2011

Tomoji Kawai
Affiliation:
The Institute of Scientific and Industrial Research, Osaka University Mihogaoka, Ibaraki, Osaka 567, Japan
Takahiro Choda
Affiliation:
The Institute of Scientific and Industrial Research, Osaka University Mihogaoka, Ibaraki, Osaka 567, Japan
Shichio Kawai
Affiliation:
The Institute of Scientific and Industrial Research, Osaka University Mihogaoka, Ibaraki, Osaka 567, Japan
Get access

Abstract

A uniform thin TiO2 film with the rutile structure which is usually made at higher than 700°C, can be formed at room temperature by the laser irradiation of adsorbed TiCl4 followed by oxidation and repeated cycles of this procedure on a silicon(100) single crystal surface. The laser irradiation to gaseous mixture of TiCl4 and oxygen from the direction parallel or perpendicular to the substrate, on the other hand, leads to the formation of a TiO2 film consisting of amorphous fine particles. The mechanism of the film formation is briefly discussed.

Type
Articles
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Solanki, R., Moore, C.A. and Collins, G.J., Solid State Technology, 28, 220 (1985).Google Scholar
2. “Laser-control led Chemical Processing of Surfaces”, Johnson, A.W., Ehrlich, D.J. and Schlossberg, H.R.(ed), North-Holland(New York, Amsterdam, Oxford), (1984).Google Scholar
3. Little, L.H., “Infrared spectra of adsorbed species”, Academic Press, New York, p 234 (1966).Google Scholar
4. Bailey, D.C. and Langer, S.H., Chemical Reviews, 81, 110 (1981).CrossRefGoogle Scholar
5. Chuiko, A.A., Tertykh, V.A., Kazakov, K.P. and Pavlov, V.V., Adsorbtsiya and adsorbentry, 8, 39 (1980).Google Scholar
6. Tsao, J.Y., Becker, R.A., Ehrlich, D.J. and Leonberger, F.J., Appl. Phys. Lett., 42, 559 (1983).CrossRefGoogle Scholar
7. Yoshikawa, A., Proceedings of the microelectronics symposium 1985, 205, Tokyo, (1985).Google Scholar