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Laser Patterning and Electrical Properties of Submicron Lines of Y-Ba-Cu-O

  • J. P Zheng (a1), Q. Y. Ying (a1), H. S. Kim (a1), D. Bhattacharya (a1), D. T. Shaw (a1) and H.S. Kwok (a1)...

Abstract

0.6 µm-wide lines of high Tc Y-Ba-Cu-O have been fabricated by direct laser writing on mirror-like thin films which were grown by laser deposition without post annealing. Laser ablation etching had no effect on the Tc and Jc until the lines were < 1µm wide. The 0.6 µm-wide strip showed some degradation of Tc and Jc. The critical current densities for these patterned lines were measured to be ∼5×106 A/cm2 at 50 K.

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1. Wu, X.D., Dijkkamp, D., Ogale, S.B., Inam, A., Chase, E.W., Miceli, P.F., Chang, C.C., Tarascon, J.M., and Venkatesan, T., Appl. Phys. Lett., 51, 861 (1987).
2. Witanachchi, S., Kwok, H.S., Wang, X.W., and Shaw, D.T., Appl. Phys. Lett., 53, 234 (1988).
3. Chaudhari, P., Koch, R.H., Laibowitz, R.B., McGuire, T.R., and Gambino, R.J., Phys. Rev. Lett., 58, 2684 (1987).
4. Hong, M., Liou, S.H., Kwo, J., and Davidson, B.A., Appl. Phys. Lett., 51, 694 (1988).
5. Koch, R.H., Umbach, C.P., Clark, G.J., Chaudhari, P., and Laibowitz, R.B., Appl. Phys. Lett., 51, 200 (1987).
6. Dykaar, D.R., Chwalek, J.M., Whitaker, J.F., Sobolewski, R., Hsiang, T.Y., and Mourou, A., in Superconductivity and Its Applications, p231, ed. Kwok, H.S. and Shaw, D.T., (Elsevier,New York) 1988.
7. Konopka, J., Sobolewski, R., Konopka, A, and Lewandowski, S.J., Appl. Phys. Lett., 53, 796 (1988).
8. Kwok, H.S., Zheng, J.P., Ying, Q.Y., and Rao, R., Appl. Phys. Lett., 54, 2473 (1989).
9. Natsui, S., Takado, N., Tsuge, H., and Asakawa, K., Appl. Phys. Lett., 52, 69 (1988).
10. Tsuge, T., Matsui, S., Matsukura, N., Kojima, Y., and Wada, Y., Jpn. J. Appl. Phys., 22, L2237 (1988).
11. Maantese, J.V., Catalan, A.B., Hamdi, A.H., Micheli, A.L., and Studer-Rabeler, K.K., Appl. Phys. Lett., 53, 526 (1988).
12. Shih, I. and Qiu, C.X., Appl. Phys. Lett., 52, 1523 (1988).
13. Inam, A., Wu, X.D., Venkatesan, T., Ogale, S.B., Chang, C.C., and Dijkamp, D., Appl. Phys. Lett., 51, 1112 (1987).
14. Gupta, A. and Koren, G., Appl. Phys. Lett., 52, 665 (1988).
15. Mannhart, J., Scheuermann, M., Tsuei, C.C., Oprysko, M.M., Chi, C.C., Umbach, C.P., Koch, R.H., and Millor, C., Appl. Phys. Lett., 52, 1271 (1988).
16. Humphreys, R.G., Satchell, J.S., Chew, N.G., and Edwards, J.A., Appl. Phys. Lett., 54, 75 (1988).
17. McWilliams, B.M., Satchell, J.S., Mitlitsky, F., Hyde, R.A., and Wood, L.L., Appl. Phys. Lett., 43, 946 (1983).
18. Podlesnik, D.V., Gilgen, H.H., and Osgood, R.M. Jr., Appl. Phys. Lett., 48, 496 (1986).
19. Yan, M.F., Barns, R.L., O'Bryan, H.M. Jr., Gallagher, P.K., Sherwood, R.C., and Jin, S., Appl. Phys. Lett., 51, 532, (1987).
20. Tam, A.C., Infrared Phys., 25, 305 (1985).

Laser Patterning and Electrical Properties of Submicron Lines of Y-Ba-Cu-O

  • J. P Zheng (a1), Q. Y. Ying (a1), H. S. Kim (a1), D. Bhattacharya (a1), D. T. Shaw (a1) and H.S. Kwok (a1)...

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