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Ionic Displacements and Piezoelectric Constants of AgGaS2 from X-Ray Diffraction of a Crystal in an External Electric Field.

  • Heinz Graafsma (a1), Jarek Majewski (a2), David Cahen (a2) and Philip Coppens (a1)

Abstract

We have determined the displacements of the ions and the changes in cell parameters which occur on application of an electric field to a crystal of AgGaS2, using a three-step modulation method. The shifts in Bragg angle of 14 reflections, due to a fieldof 2.6 x 106 V/m applied nearly parallel to [221], were used to refine the change in cell parameters. The resulting piezo-electric coefficients are d14=d25 =8.8 (0.9) 10-12 C/N and d36=7.6 (1.8) 10-12 C/N. This leads to a value of 4.8 (0.5) pC/Nfor the piezoelectric constant in the [221] direction which compares well with a value of 5-6 10-12 C/N determined by other methods. The ionic displacements were studied on a second sample, with E=2.6x 106 V/m in adirection parallel to [110]. Very small, but significant a and b directiondisplacements were observed for all atoms, whereas the displacements in the c direction were negligible as expected. Relative to the sulfur framework, the Ga ion displacement is considerably larger than that of the Ag ions.

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Ionic Displacements and Piezoelectric Constants of AgGaS2 from X-Ray Diffraction of a Crystal in an External Electric Field.

  • Heinz Graafsma (a1), Jarek Majewski (a2), David Cahen (a2) and Philip Coppens (a1)

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