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INTERFACIAL DEFECTS AND EPITAXY

  • R.C. POND (a1)

Abstract

It is shown that interfacial defects are characterised by combinations of symmetry operations, one from each of the adjacent crystals. This approach demonstrates that the variety of possible interfacial defects is broader than had been previously recognised, and includes disclinations and dispirations in addition to dislocations. The condition of the initial substrate surface is shown to have a very important influence on the character and stability of interfacial defects.

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References

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1. Matthews, J.W., 1975, Epitaxial Growth, Mat. Sci. Series, Academic Press, New York.
2. Pond, R.C. and Bollmann, W., 1979, Phil. Trans. Roy. Soc. Lond. 292, 449.
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