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In-situ TEM observation of electromagnetic field in some real materials

  • Katsuhiro Sasaki (a1), Zhouguang Wang (a2), Keiichi Fukunaga (a3), Tsukasa Hirayama (a4), Kotaro Kuroda (a5) and Hiroyasu Saka (a6)...

Abstract

Electromagnetic fields presents in some real materials have been observed using electron holography and a simple method named the Shadow Image Distortion (SID) method which we have developed. The in-situ electron holography observation of the electric field surrounding a ceramic particle showed the rapid degradation of dielectric properties of the particle at an elevated temperature. The cross sectional view of mean electrostatic potential distributions in a silicon device has been observed. In-situ electron holography and SID observations showed the electrostatic potential distribution across a reverse biased p-n junction in a compound semiconductor. The SID method using a dedicated tool allowed single-step imaging of 2D maps of electromagnetic field.

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Keywords

In-situ TEM observation of electromagnetic field in some real materials

  • Katsuhiro Sasaki (a1), Zhouguang Wang (a2), Keiichi Fukunaga (a3), Tsukasa Hirayama (a4), Kotaro Kuroda (a5) and Hiroyasu Saka (a6)...

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