Hostname: page-component-745bb68f8f-mzp66 Total loading time: 0 Render date: 2025-01-15T14:56:32.704Z Has data issue: false hasContentIssue false
  • English
  • Français

In-Situ Surface Observation of C-Axis Oriented YBa2Cu3O7−x Thin Films by Leed, XPS and ISS

Published online by Cambridge University Press:  26 February 2011

S. Tanaka ,
T. Nakamura ,
H. Tokuda  and
M. Iiyama
S. Tanaka
Affiliation:
Sumitomo Electric Industries, LTD., Information & Electronics Laboratories, 1–1–3, Shimaya, Konohana-ku, Osaka 554, Japan
T. Nakamura
Affiliation:
Sumitomo Electric Industries, LTD., Information & Electronics Laboratories, 1–1–3, Shimaya, Konohana-ku, Osaka 554, Japan
H. Tokuda
Affiliation:
Sumitomo Electric Industries, LTD., Information & Electronics Laboratories, 1–1–3, Shimaya, Konohana-ku, Osaka 554, Japan
M. Iiyama
Affiliation:
Sumitomo Electric Industries, LTD., Information & Electronics Laboratories, 1–1–3, Shimaya, Konohana-ku, Osaka 554, Japan
Get access

1. abstract

In an ultra-high vacuum equipment, YBa2CU3O7−x (YBCO) thin films were deposited by the ozone-assisted co-evaporation method and their surfaces were investigated by LEED, XPS and ISS without breaking the vacuum. A LEED pattern was observed for the first time at an as-deposited surface. A clean, crystalline and superconducting surface was preserved to the top of the film. Only Cu atoms were detected at the first monolayer by ISS, suggesting that clean surfaces are stabilized by Cu-O layers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 275: Symposium S – Layered Superconductors: Fabrication, Properties and Applications , 1992 , 395
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

7. References

1. Matijasevic, V., Rosenthal, P., Shinohara, K., Marshall, A. F., Hamond, R. H., and Beasley, M. R., J. Mater. Res. 6, 682(1991).Google Scholar
2. Terashima, T., Shimura, K., Satoh, T., Bando, Y., Matsuda, Y., Fujiyama, A., Komiyama, S., Kamigaki, K. and Terauchi, H., J. Crysl. Growth. 115, 745(1991).Google Scholar
3. Kubinski, D. J., Hoffman, D. W., Soltis, R. E., Logothetis, E. M., J. Appl. Phys. 71, 1860(1992).Google Scholar
4. Li, Q., Venkatesan, T. and Xi, X.X., Physica C 190, 22(1991).Google Scholar
5. Tanaka, S., Nakanishi, H., Matsuura, T., Higaki, K., Itozaki, H. and Yazu, S., Advances in Superconductivity 3, (Springer-Verlag, Tokyo, 1991), p. 1183.Google Scholar
6. Buyuklimanli, T. H. and Simmons, J. H., Phys. Rev. B 44, 727(1991).Google Scholar
7. Tanaka, S., Nakamura, T., Iiyama, M., Yoshida, N. and Takano, S., Jpn. J. Appl. Phys. S8, L1458(1991).Google Scholar
8. Niehus, H. and Spitzl, R., Surf. Interface Anal. 17, 287(1991).Google Scholar
9. Tanaka, S., Nakamura, T., Tokuda, H., Iiyama, M., submitted to Appl. Phys. Lett.Google Scholar
10. Fork, W. K., Chen, C. T., Anderson, J., Kwo, J., Liou, S. H., Hong, M., Rubenacker, G. V. and Drumheller, J. E., Phys. Rev. B 37, 7924(1988).Google Scholar
11. Balzarotti, A., Patella, F., Crescenzi, M. D., Motta, N., Sgarlata, A., Licci, F., Phys. Rev. B, 43, 351(1991).Google Scholar
12. Guyot, H., Physica C. 180, 108(1991).Google Scholar
13. Pennycook, S. J., Chisholm, M. F., Jesson, D. E., Norton, D. R., Lowndes, D. H., Feenstra, R., Kerchner, H. R., Thomson, J. O., Phys. Rev. Lett. 67, 765(1991).Google Scholar
14. Tanaka, S., Nakamura, T., Iiyama, M., Yoshida, N., Takano, S., Shoji, F. and Oura, K., Appl. Phys. Lett. 59, 3637(1991).Google Scholar