Hostname: page-component-848d4c4894-jbqgn Total loading time: 0 Render date: 2024-06-25T23:46:51.082Z Has data issue: false hasContentIssue false

In-Situ Diagnostics of Diamond CVD

Published online by Cambridge University Press:  25 February 2011

J. E. Butler
Affiliation:
Chemistry Division, Naval Research Laboratory, Washington, DC 20375-5000.
F. G. Celii
Affiliation:
Chemistry Division, Naval Research Laboratory, Washington, DC 20375-5000.
P. E. Pehrsson
Affiliation:
Chemistry Division, Naval Research Laboratory, Washington, DC 20375-5000.
H. -t. Wang
Affiliation:
Chemistry Division, Naval Research Laboratory, Washington, DC 20375-5000.
H. H. Nelson
Affiliation:
Chemistry Division, Naval Research Laboratory, Washington, DC 20375-5000.
Get access

Abstract

The deposition of diamond, a metastable crystalline form of carbon, from low pressure gases poses intriguing questions about the mechanisms of growth. Tunable IR Diode Laser Absorption Spectroscopy, Laser Multi-Photon Ionization Spectroscopy, and Laser Induced Fluorescence were used to characterize the gaseous environment in the Chemical Vapor Deposition growth of diamond films. The quality of the deposited material was examined by optical and SEM microscopies, and Raman, Auger, and XPS spectroscopies. When a reactant mixture of 0.5% methane in hydrogen, was passed across a hot Tungsten filament (2000 C), C2H2, C2H4, H and CH3 were detected above the growing diamond surface, and concentration limits for undetected species were determined. These results are discussed in terms of simple models for species formation and consumption, as well as the implications for the diamond growth mechanism.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Field, J.E., The Properties of Diamond, Academic Press, New York, 1979.Google Scholar
2. DeVries, R.C., Ann. Rev. Mater. Sci. 17, 161 (1987).Google Scholar
3. Matsumoto, S., Sato, Y., Kamo, M., and Setaka, N., Jpn. J. Appl. Phys. 21, L183 (1982).CrossRefGoogle Scholar
4. Hirose, Y., and Terasawa, Y., Jpn. J. Appl. Phy. 25, L519 (1986).CrossRefGoogle Scholar
5. Singh, B., Arie, Y., Levine, A.W., and Mesker, O.R., Appl. Phys. Lett. 52, 451 (1988).Google Scholar
6. Moustakas, T.D., Dismukes, J.P., Ye, L., Walton, K.R., and Tiedje, J.T., Proc. of the 10th International Conference on Chemical Vapor Deposition, The Electrochemical Society, Inc., 1164 (1987).Google Scholar
7. Celii, F.G., Pehrsson, P.E., Wang, H.-t., and Butler, J.E., Appl. Phys. Lett. 52, 2043 (1988).Google Scholar
8. Celii, F.G. and Butler, J.E., Appl. Phys. Lett., submitted for publication.Google Scholar
9. Hudgens, J.W., DiGuiseppe, T.G. and Lin, M.C., J. Chem. Phys. 79, 571 (1983).Google Scholar
10. Tjossem, P.J.H. and Cool, T.A., Chem. Phys. Lett. 100, 479 (1983).CrossRefGoogle Scholar
11. Jackson, D.J. and Wynne, J.J., Phys. Rev. Lett. 49, 543 (1982); M.G. Payne, W.R. Garrett and W.R. Ferrell, Phys. Rev. A 34, 1143 (1986).Google Scholar
12. Gordon, S. and McBride, B.J., “Computer Program for Chemical Equilibrium Calculations,” NASA-Lewis Research Center, NASA SP-273, March, 1973.Google Scholar
13. Harris, S. J., Weiner, A. M., and Perry, T. A., Appl. Phys. Lett. 53, 1605 (1988).Google Scholar