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Initial Experiences with a 300-Kv Hrem Converted for UHV Operation

Published online by Cambridge University Press:  21 February 2011

David J. Smith ,
J. Podbrdsky ,
P. R. Swann  and
J. S. Jones
David J. Smith
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ 85287
J. Podbrdsky
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ 85287
P. R. Swann
Affiliation:
Gatan Inc., 6678 Owens Drive, Pleasanton, CA 94566.
J. S. Jones
Affiliation:
Gatan Inc., 6678 Owens Drive, Pleasanton, CA 94566.
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Abstract

A Philips 430ST high-resolution electron microscope has been converted for ultra-high-vacuum operation by substitution with a novel specimen chamber, which also incorporates a flexible chamber for specimen preparation and treatment, and additional pumping facilities. Key features of the design include a single-tilt specimen holder with in situ heating to 1200° C, and liquid-helium-cooled cryofingers above and below the sample. Initial operating experiences indicate that the microscope performance has not been compromised by the UHV conversion. However, selection of optimum imaging conditions is difficult for a clean crystalline material.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 289
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Gibson, J.M., McDonald, M.L. and Unterwald, F.C., Phys. Rev. Letts. 55 (1985) 1765.Google Scholar
2. Ponce, F.A., Suzuki, S., Kobayashi, M., Ishibashi, Y., Ishida, Y. and Eto, T., in Proc. 44th Ann. Meet. EMSA, edited by Bailey, G.W. (San Francisco Press, San Francisco, 1986) p. 606.Google Scholar
3. Takayaagi, K., Tanishiro, Y., Kobayashi, K., Yamamoto, N., Yagi, K., Ohi, K., Kondo, Y., Hirano, H., Ishibashi, Y., Kobayashi, H. and Harada, Y., in Electron Microscopy 1986, p. 1337.Google Scholar
4. Marks, L.D., Kubozoe, M., Tomita, M., Ukiana, M., Furutsu, T. and Matsui, I., in Proc. 46th Ann. Meet. EMSA, edited by Bailey, G.W. (San Francisco Press, San Francisco, 1988) p. 658.Google Scholar
5. Swann, P.R., Jones, J.S., Krivanek, O.L., Smith, D.J., Venables, J.A. and Cowley, J.M., in Proc. 45th Ann. Meet. EMSA, edited by Bailey, G.W. (San Francisco Press, San Francisco, 1987) p. 136.Google Scholar