Fe/Au and Fe/Ag films grown on MgO(001) oriented substrates exhibit the same in-plane epitaxy since Au and Ag have the same fcc bulk structure and nearly equivalent lattice parameters. Using synchrotron X-ray reflectivity and high-angle Bragg scattering we show that Fe(15Å)/Au(21Å) multilayers grown by sputtering exhibit different profiles for Fe/Au and Au/Fe interfaces. We analyze this in view of the action of Au as a surfactant during the growth of Fe. Similar Fe/Ag multilayers have considerably worse interfacial quality since Fe and Ag do not interdiffuse, and this leads to the result that the interfaces cannot be described by error function profiles. Using non-specular x-ray reflectivity we show that whereas Fe/Au interfaces are self-affine, Fe/Ag interfaces exhibit two regimes of scaling behavior as a function of spatial wavelength. This suggests that two different mechanisms are important in describing the growth of Fe/Ag films.