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Incoherent Imaging by Z-Contrast Stem: Towards 1Å Resolution

  • S. J. Pennycook (a1), D. E. Jesson (a1) and A. J. Mcgibbon (a1)

Abstract

By averaging phase correlations between scattered electrons a high angle detector in the scanning transmission electron microscope (STEM) can provide an incoherent, Z-contrast image at atomic resolution. Phase coherence is effectively destroyed through a combination of detector geometry (transverse incoherence) and phonon scattering (longitudinal incoherence). Besides having a higher intrinsic resolution, incoherent imaging offers the possibility of robust reconstruction to higher resolutions, provided that some lower frequency information is present in the image. This should have value for complex materials and regions of complex atomic arrangements such as grain boundaries. Direct resolution of the GaAs sublattice with a 300kV is demonstrated.

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1. Scherzer, O., J. Appl. Phys. 20 20 (1949).
2. Crewe, A. V., Wall, J. and Langmore, J., Science 168, 1338 (1970).
3. Engel, A., Wiggins, J. W., and Woodruff, D. C., J. Appl. Phys. 45, 2739 (1974).
4. Crewe, A. V., Langmore, J. P., and Isaacson, M. S., in Physical Aspects of Electron Microscopy and Microbeam Analysis, edited by Siegel, B. M. and Beaman, D. R. (Wiley and Sons, New York, 1975), p. 47.
5. Wall, J., Langmore, J., Isaacson, M., and Crewe, A. V., Proc. Nat. Acad. Sci. 71, 1 (1974)
6. Isaacson, M. S., Ohtsuki, M., and Utlaut, M., in Introduction to Analytical Electron Microscopy, edited by Hren, J. J., Goldstein, J. I., and Joy, D. C., (Plenum Press, New York, 1979), p. 343.
7. Cowley, J. M., Ultramicroscopy 2, 3 (1976).
8. Ade, G., Optik 49, 113 (1977).
9. Jesson, D. E. and Pennycook, S. J., Proc. R. Soc. Lond. A441, 261 (1993).
10. Spence, J. C. H., Zuo, J. M., and Lynch, J., Ultramicroscopy 32, 233 (1989).
11. Loane, R. F., Xu, P., and Silcox, J., Acta. Cryst. A47, 267 (1991).
12. Pennycook, S. J. and Jesson, D. E., Ultramicroscopy 37, 14 (1991).
13. Jesson, D. E. and Pennycook, S. J., Proc. R. Soc. Lond. submitted (1993).
14. Hall, C. R. and Hirsch, P. B., Proc. Roc. Soc. A 286, 158177 (1965).
15. Bird, D. M. and Q King, A., Acta Cryst. A46, 202 (1990).
16. Allen, L. J. and Rossouw, C. J., Phys. Rev. B42, 11644 (1990)
17. Treacy, M. M. J. and Gibson, J. M., these proceedings.
18. Warren, B. E., X-Ray Diffraction, (Dover Publishing, New York, 1990).
19. Fertig, J. and Rose, H., Optik 59, 407 (1981).
20. Loane, R. F., Kirkland, E. J., and Silcox, J., Acta. Cryst. A44, 912 (1988).
21. Pennycook, S. J. and Jesson, D. E., Acta Metall. Mater. 40, Suppl. S149 (1992).
22. Cowley, J. M., and Huang, Y., Ultramicroscopy 40, 171 (1992).
23. Perovic, D. D., Howie, A. and Rossouw, C. J., Phil. Mag. Letts. 67, 261 (1993)
24. Gull, S. F., and Skilling, J., IEE Proc. 131F 646 (1984).
25. Pennycook, S. J., Jesson, D. E., Chisholm, M. F., Ferridge, A. G. and Seddon, M. J., Proc. 10th Pfefferkom Conf. on Signal and Image Processing, Cambridge, U. K. (Scanning Microscopy International, AMF O'Hare, in press).
26. Xu, P., Kirkland, E. J., Silcox, J., and Keyse, R., Ultramicroscopy 32, 93 (1990).
27. McGibbon, A. J., Pennycook, S. J. and Wasilewski, Z. in Growth Processing and Characterization of Semiconductor Heterostructures, edited by Gumbs, G., Luryi, S., Weiss, B., and Wicks, G. W. (Mater. Res. Soc. Proc. 326, Pittsburg, PA, 1994, in press)
28. Browning, N. D., and Pennycook, S. J., Microbeam Analysis 2, 81 (1993).
29. Browning, N. D., Chisholm, M. F., and Pennycook, S. J., Nature 366, 143 (1993).

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