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In situ X-ray Reflectivity Study of Oxidation Kinetics in Iron and Stainless steel

  • D. H. Kim (a1), S. S. Kim (a1), H. H. Lee (a1), H. W. Jang (a1), J. W. Kim (a1), M. Tang (a2), K. S. Liang (a2), S. K. Sinha (a3) and D. Y. Noh (a1)...

Abstract

In situ specular x-ray reflectivity was applied to study the growth kinetics of passive oxide films on iron and stainless steel substrates in pH 8.4 borate buffer solution. Under electrical potential from 0 to 800 mV, the growth rate of oxide films decreases exponentially in thickness following the direct logarithmic growth law predicted in the point defect model. The electric field in the oxide on iron is independent of the applied potentials consistent with the point defect model. In stainless steel, however, the electric field depends strongly on the applied potential indicating that the oxide properties change as the applied potential varies.

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In situ X-ray Reflectivity Study of Oxidation Kinetics in Iron and Stainless steel

  • D. H. Kim (a1), S. S. Kim (a1), H. H. Lee (a1), H. W. Jang (a1), J. W. Kim (a1), M. Tang (a2), K. S. Liang (a2), S. K. Sinha (a3) and D. Y. Noh (a1)...

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