Hostname: page-component-7bb8b95d7b-w7rtg Total loading time: 0 Render date: 2024-09-24T12:10:13.179Z Has data issue: false hasContentIssue false

In Situ Transmission Electron Microscope Studies of Ion Irradiation-Induced and Irradiation-Enhanced Phase Changes

Published online by Cambridge University Press:  28 February 2011

Charles W. Allen*
Affiliation:
HVEM-Tandem Facility, Argonne National Laboratory, Argonne, IL 60439 USA
Get access

Abstract

Motivated at least initially by materials needs for nuclear reactor development, extensive irradiation effects studies employing transmission electron microscopes (TEM) have been performed for several decades, involving irradiation-induced and irradiation-enhanced microstructural changes, including phase transformations such as precipitation, dissolution, crystallization, amorphization, and order-disorder phenomena. From the introduction of commercial high voltage electron microscopes (HVEM) in the mid-1960s, studies of electron irradiation effects have constituted a major aspect of HVEM application in materials science. For irradiation effects studies two additional developments have had particularly significant impact; (1) the development of TEM specimen holders in which specimen temperature can be controlled in the range 10–2200 K and (2) the interfacing of ion accelerators which allows in situ TEM studies of irradiation effects and the ion beam modification of materials within this broad temperature range. This paper treats several aspects of in situ studies of electron and ion beam-induced and enhanced phase changes and presents two case studies involving in situ experiments performed in an HVEM to illustrate the strategies of such an approach of the materials research of irradiation effects.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Phase Transformations During Irradiation. Nolfi, F. V. Jr, ed. (Applied Science Publishers, Barking, England, 1983).Google Scholar
[2] Phase Stability During Irradiation. Holland, J. R., Mansur, L. and Potter, D. I., eds. (Metallurgical Society of AIME, New York, 1981).Google Scholar
[3] Machlin, E. S. and Roland, T. J., in Synthesis and Properties of Metastable Phases (American Institute of Mining, Metallurgical and Petroleum Engineers, New York, 1980).Google Scholar
[4] Okamoto, P. R. and Meshii, M., Science of Advanced Materials. Wiedersich, H. and Meshii, M., eds. ASM—International, Materials Park, 1990) 33.Google Scholar
[5] Lam, N. Q. and Okamoto, P. R., ASTM Special Publication 870 (1985) 430.Google Scholar
[6] Liu, J. C., Li, J., Mayer, J. W., Allen, C. W. and Rehn, L. E., in Processing and Characterization of Materials Using Ion Beams. Rehn, L. E. R., Greene, J. and Smidt, F. A., eds. (Mater. Res. Soc. Proc. 128, Pittsburgh, 1988) 297.Google Scholar
[7] King, W. E., Merkle, K. L. and Meshii, M., Phys. Rev. B, 23 (1981) 6319.Google Scholar
[8] Luzzi, D. E., Mori, H., Fujita, H. and Meshii, M., Acta Metall. 34 (1986) 629.Google Scholar
[9] Luzzi, D. E. and Meshii, M., J. Mater. Res. 1 (1986) 617.Google Scholar
[10] Mori, H. and Fujita, H., Symp. Proc. New Directions and Future Aspects of HVEM. Osaka, to be published in Ultramicroscopy (1992).Google Scholar
[11] Urn, N. Q. and Okamoto, P. R., in Effects of Radiation on Materials. ASTM STP 870, Garner, F. A. and Perrin, J. S., eds. (American Society for Testing and Materials, Philadelphia, 1985) 420.Google Scholar
[12] Allen, C. W., Rehn, L. E. and Wiedersich, H., Appl. Phys. Lett. 50 (1987) 1876.CrossRefGoogle Scholar
[13] Im, J. S. and Atwater, H. A., Appl. Phys. Lett. 57 (1990) 1766.Google Scholar
[14] Smith, D. A. and Allen, C. W., Ultramicroscopy 37 (1991) 279.Google Scholar
[15] Allen, C. W., Funk, L.L., Ryan, E. A. and Ockers, S. T., Nucl Instr and Methods in Phys Res B40/41 (1989) 553.Google Scholar
[16] Allen, C. W. and Rehn, L.E., Ultramicroscopy 30 (1989) 188.CrossRefGoogle Scholar
[17] Allen, C. W. and Smith, D. A., in Surface Chemistry and Beam-Solid Interactions. Atwater, H., Houle, F. and Lowndes, D., eds. (Mater. Res. Soc. Proc. 201, Pittsburgh, 1991) 405.Google Scholar
[18] Alien, C. W. and Smith, D. A., Symp. Proc. New Directions and Future Aspects of HVEM. Osaka, to be published in Ultramicroscopy (1992).Google Scholar