Skip to main content Accessibility help
×
Home

In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques

  • Thomas W. Cornelius (a1), Zhe Ren (a1), Francesca Mastropietro (a1), Simon Langlais (a2), Anton Davydok (a1), Marie-Ingrid Richard (a1) (a3), Maxime Dupraz (a2), Marc Verdier (a2), Guillaume Beutier (a2), Peter Boesecke (a3) and Olivier Thomas (a1)...

Abstract

A scanning force microscope for in situ nanofocused X-ray studies (SFINX) has been developed which can be installed on diffractometers at synchrotron beamlines allowing for the combination with various techniques such as coherent X-ray diffraction and fluorescence. The capabilities of this device are demonstrated on Cu nanowires and on Au islands grown on sapphire (0001). The sample topography, crystallinity, and elemental distribution of the same area are investigated by recording simultaneously an AFM image, a scanning X-ray diffraction map, and a fluorescence map. Additionally, the mechanical response of Au islands is studied by in situ indentation tests employing the AFM-tip and recording 2D X-ray diffraction patterns during mechanical loading.

Copyright

References

Hide All
1. Uchic, M.D., Dimiduk, D.M., Florando, J.N., Nix, W.D., Science 305, 986 (2004).
2. Bei, H., Shim, S., George, E., Miller, M., Herbert, E., Pharr, G., Scripta Mater. 57, 397 (2007).
3. Richter, G. et al. ., Nano Letters 9, 3048 (2009).
4. Kiener, D., Grosinger, W., Dehm, G., Pippan, R., Acta Materialia 56, 580 (2008).
5. Chen, L.Y., Richter, G., Sullivan, J.P., Gianola, D.S., Phys. Rev. Lett. 109, (2012).
6. Minor, A.M., Morris, J.W., Stach, E.A., Appl. Phys. Lett. 79, 1625 (2001).
7. Maaß, R., van Petegem, S., Borca, C., van Swygenhoven, H., Mat. Sci. Eng. A 524, 40 (2009)
8. Kirchlechner, C. et al. ., Acta Mater. 60, 1252 (2012).
9. Scheler, T. et al. ., Appl. Phys. Lett. 94, 023109 (2009).
10. Rodrigues, M.S. et al. ., J. Instrum. 3, 12004 (2008).
11. Rodrigues, M.S. et al. ., J. Appl. Phys. 106, 103525 (2009).
12. Beutier, G. et al. ., J. Phys. Conf. Ser. 425, 132003 (2013).
13. Sadan, H., Kaplan, W., J. Mater. Sci. 41, 5099 (2006).
14. Toimil Molares, M.E., et al. ., Adv. Mater. 13, 62 (2001).
15. Akiyama, T., Staufer, U., de Rooij, N.F., Frederix, P., Engel, A., Rev. Sci. Instr. 74, 112 (2003).
16. Ren, Z. et al. ., submitted to J. Synchrotron Radiat. (under review).
17. Mastropietro, F. et al. ., Optics Express 19, 19223 (2011).
18. Eshelby, J.D., J. Appl. Phys. 24, 176 (1953).
19. Mordehai, D., Kazakevich, M., Srolovitz, D.J., Rabkin, E., Acta Materialia 59, 2309 (2011).

Keywords

In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques

  • Thomas W. Cornelius (a1), Zhe Ren (a1), Francesca Mastropietro (a1), Simon Langlais (a2), Anton Davydok (a1), Marie-Ingrid Richard (a1) (a3), Maxime Dupraz (a2), Marc Verdier (a2), Guillaume Beutier (a2), Peter Boesecke (a3) and Olivier Thomas (a1)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed