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Imprint in Ferroelectric Thin Films Caused by Screening of an Electric Field in a Thin Surface Layer

  • Michael Grossmann (a1), Oliver Lohse (a1), Dierk Bolten (a1), Ulrich Boettger (a1) and Rainer Waser (a2)...


Imprint describes an aging effect in ferroelectric thin films which manifests itself by a shift of the P-V hysteresis loop on the voltage axis. In this paper a mechanism is described which attributes imprint to the screening of a large electric field within a thin surface layer by electronic charges. The field at the surface arises due to the existence of a thin surface layer in which the spontaneous ferroelectric polarization is suppressed. In the course of aging this field is gradually screened by electronic charges which are generated by a Frenkel-Poole effect and then become trapped near the electrode-thin-film interface causing the shift of the hysteresis loop. A numerical simulation based on this model allows a quantitative description of the imprint effect as a function of various experimental parameters.



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1. Scott, J. F. and Araujo, C. A. Paz de, Science 246, 1400 (1989).
2. Araujo, C. A. Paz de, Cuchiaro, J. D., McMillan, L. D., Scott, M. C., and Scott, J. F., Nature 374, 627 (1995).
3. Warren, W., Tuttle, B., Dimos, D., Pike, G., Al-Shareef, H., Ramesh, R., and Evans, J., Jap. J. Appl. Phys., 1521 (1996).
4. Grossmann, M., Lohse, O., Bolten, D., Boettger, U., Waser, R., Hartner, W., Kastner, M., and Schindler, G., Appl. Phys. Lett. 76, 363 (2000).
5. Merz, W., Phys. Rev. A 91, 513 (1953).
6. Carl, K. and Härdtl, K., Ferroelectrics 17, 473 (1978).
7. Arlt, G. and Neumann, H., Ferroelectrics 87, 109 (1988).
8. Warren, W., Dimos, D., Pike, G., Vanheusden, K., and Ramesh, R., Appl. Phys. Lett. 67, 1689 (1995).
9. Kim, S.-H., Woo, H.-J., Ha, J., Hwang, C.S., Kim, H.R., and Kingon, A.I., Appl. Phys. Lett. 78, 2885 (2001).
10. Dimos, D., Warren, W., Sinclair, M., Tuttle, B., and Schwartz, R., J. Appl. Phys. 76, 4305 (1994).
11. Fridkin, V. M., Photoferroelectrics, Solid State Sciences (Springer-Verlag, 1979).
12. Grossmann, M., Lohse, O., Bolten, D., Waser, R., Hartner, W., Schindler, G., Dehm, C., and Nagel, N., Mat. Res. Soc. Symp. Proc. 541, 269 (1999).
13. Grossmann, M., Lohse, O., Bolten, D., Boettger, U., Schneller, T., and Waser, R., unpublished (2001).
14. Känzig, W., Phys. Rev. A 98, 549 (1955).
15. Christen, H.-M., Mannhart, J., Williams, E., and Gerber, C., Phys. Rev. B 49, 12095 (1994).
16. Cillessen, J., Prins, M., and Wolf, R., J. Appl. Phys. 81, 2777 (1997).
17. Tagantsev, A. and Stolichnov, I., Appl. Phys. Lett. 74, 1326 (1999).
18. Bratkovsky, A.M. and Levanyuk, A. P., Phys. Rev. Lett. 84, 3177 (2000).
19. Frey, M.H., Xu, Z., Han, P., and Payne, D., Ferroelectrics 206–207, 337 (1998).
20. Shaw, T.M., Suo, Z., Huang, M., Liniger, E., Laibowitz, R.B., and Baniecki, J.D., Appl. Phys. Lett. 75, 2129 (1999).
21. Streiffer, S., Basceri, C., Parker, C., Lash, S., and Kingon, A., J. Appl. Phys. 86, 4565 (1999).
22. Sze, S.M., Physics of Semiconductor Devices (Wiley and Sons, 1981).
23. Grossmann, M., Lohse, O., Schneller, T., Bolten, D., Boettger, U., Rodriguez, J., Kohlstedt, H., and Waser, R., Int. Ferroelectrics, in press (2001).
24. Cross, J., Fujiki, M., Tsukada, M., Matsuura, K., Otani, S., Tomotani, M., Kataoka, Y., Kotaka, Y., and Goto, Y., Integ. Ferroelectrics 25, 265(1999).
25. Stolichnov, I., Tagantsev, A., Setter, N., Cross, J., and Tsukada, M., Appl. Phys. Lett. 74, 3552 (1999).
26. Morimoto, T., Hidaka, O., Yamakawa, K., Ariusmi, O., Kanaya, H., Iwamoto, T., Kumura, Y., Kunishima, I., and Tanaka, A., Jpn. J. Appl. Phys. 39, 2110 (2000).
27. Lee, J., Thio, C., Bhattacharya, M., and Desu, S., Mat. Res. Soc. Symp. Proc. 261, 241 (1995).
28. Desu, S. and Vendik, O., Int. Ferroelectrics 28, 175 (2000).

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Imprint in Ferroelectric Thin Films Caused by Screening of an Electric Field in a Thin Surface Layer

  • Michael Grossmann (a1), Oliver Lohse (a1), Dierk Bolten (a1), Ulrich Boettger (a1) and Rainer Waser (a2)...


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