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Hrem Observations, Peels Analysis and Numerical Simulations of Au/Ni Mbe Multilayers

Published online by Cambridge University Press:  21 February 2011

Pascale Bayle
Affiliation:
CEA/Département de Recherche Fondamentale sur la Matière Condensée/SP2M, Centre d'Etudes Nucléaires, 38054 Grenoble, Cedex 9, France
T. Deutsch
Affiliation:
CEA/Département de Recherche Fondamentale sur la Matière Condensée/SP2M, Centre d'Etudes Nucléaires, 38054 Grenoble, Cedex 9, France
B. Gilles
Affiliation:
LTPCM, ENSEEG, BP 75, 38042, Grenoble, France
F. LancÇn
Affiliation:
CEA/Département de Recherche Fondamentale sur la Matière Condensée/SP2M, Centre d'Etudes Nucléaires, 38054 Grenoble, Cedex 9, France
A. Marty
Affiliation:
CEA/Département de Recherche Fondamentale sur la Matière Condensée/SP2M, Centre d'Etudes Nucléaires, 38054 Grenoble, Cedex 9, France
J. Thibault
Affiliation:
CEA/Département de Recherche Fondamentale sur la Matière Condensée/SP2M, Centre d'Etudes Nucléaires, 38054 Grenoble, Cedex 9, France
C. Colliex
Affiliation:
Laboratoire de Physique des Solides associé au CNRS, Université Paris Sud, Bât 510, 91405 Orsay, France
M. Tence
Affiliation:
Laboratoire de Physique des Solides associé au CNRS, Université Paris Sud, Bât 510, 91405 Orsay, France
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Abstract

The structural evolution of Au/Ni multilayers (with an increasing number of Ni monolayers (MLs)) has been investigated by HREM. As soon as the thickness of Ni becomes larger than 5 MLs, a structural change occurs which in fact has been predicted by numerical simulations. The deformation in the multilayer has been characterised by HREM image processing and has been related to the Ni profile. This profile has been compared to the chemical profile obtained by scanning PEELS analysis through the multilayer.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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