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High-Tc Superconducting Films Irradiated with Low-Energy Oxygen Ion Beam

Published online by Cambridge University Press:  25 February 2011

V. V. Phedotova
Affiliation:
Institute of Solid State and Semiconductor Physics, P. Brovki 17, Minsk 220072, Republic of Belarus.
A. V. Zoubetz
Affiliation:
Institute of Solid State and Semiconductor Physics, P. Brovki 17, Minsk 220072, Republic of Belarus.
A. P. Ges
Affiliation:
Institute of Solid State and Semiconductor Physics, P. Brovki 17, Minsk 220072, Republic of Belarus.
A. I. Stognij
Affiliation:
Institute of Solid State and Semiconductor Physics, P. Brovki 17, Minsk 220072, Republic of Belarus.
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Abstract

LPE-grown YBCO single crystal films were irradiated with oxygen ion beam up to a fluence level of 8 × 1019 cm−2 Irradiation parameters were as follows: , beam energy 0.8 keV, current density 0.4 mA/cm2. Ultimate vacuum was not less than 5 × 10−6 Torr, operating vacuum was 2 × 10−4 Torr. Tc = 53K and transition width ΔT> 10 K characterized the starting state of the films. After irradiation Tc was found to increase up to 94 K and Δ to decrease down to 0.5 K. Proceeding from transition character one can conclude that the irradiated film composition was changing into a single phase one. Half widths of the characteristic peaks of x-ray spectra were decreasing with the increase in fluence. The best results were obtained upon the irradiation of cooled samples. Upon heating the samples up to 600° C it was impossible to obtain Tc = 86 k and ΔT = 2 K.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Fujita, J., Yositake, T., Kamijyo, A. et al, Nucl. Inst. and Meth. in Phys. Res. B 39 (1989) 644647.CrossRefGoogle Scholar
2. White, A. E., Short, K. T., Jacobson, D. C. et al., Phys. Rev. B. 37, 3755 (1988).CrossRefGoogle Scholar
3. Enokihara, A., Higashino, H., Setsune, K. and Wasa, K., Jap. J. Appl Phys. 28 (1989) L452.CrossRefGoogle Scholar
4. Barilo, S. N., Bytchkov, , Ges, A. P. et al., Applied Superconductivity Conference, August 23–28, 1992, Technical Program Including Abstracts, p.141.Google Scholar
5. Stognij, A. I. and Tokarev, V. V., MRS Proc. Vols. 158, (1990).Google Scholar
6. Sputtering by Particle Bombardment II, Edited by Behrisch, R., Springer-Verlag, 1983, p.472.CrossRefGoogle Scholar
7. Ges, A., Zubetz, A., Stognij, A. et al., Pisma v Zhurnal Tekh-nicheskoj Piziki, 1990, vol. 16, Iss. 21, pp. 6569.Google Scholar