Skip to main content Accessibility help
×
Home

High-Resolution Transmission Electron Microscopy Study of Metallic Spin-Glass/Amorphous Silicon Multilayers

  • David A. Howell (a1), Martin A. Crimp (a1), Lilian M. Hoines (a2) and J. Bass (a2)

Abstract

High-resolution transmission electron microscopy has been used to investigate the structure and growth behavior of three separate multilayer systems composed of spin-glass alloys(AuFe.03,CuMn.15, and AgMn.09) alternating with amorphous silicon. Each of the three systems was fabricated with two different sample configurations. The first consisted of bilayers with 3 nm spinglass alloy and 7 nm amorphous siliconlayers. The second consisted of 7 nm spin-glass alloy and 7 nm amorphous silicon layers. HRTEM images of ion-milled cross-sectioned samples revealed variations in the degree of crystallinity of the spin-glass material. Variations in the amount and symmetry of interlayer formation were also observed. Systematic studies of such variations should help to explain differences in their measured spin-glass properties.

Copyright

References

Hide All
[1] Shinjo, T., in Metallic Superlattices, Artificially Structured Materials, edited by Shinjo, T. and Takada, T. (Elsevier Science Publishers B.V., Amsterdam, The Netherlands, 1987) p. 1.
[2] Cowen, J.A., Kenning, G.G., and Bass, J., J. Appl. Phys. 64, 5781 (1988).
[3] Kenning, G.G., Bass, J., Pratt, W.P. Jr., Leslie-Pelecky, D., Hoines, L., Leach, W., Wilson, M.L., Stubi, R., and Cowen, J.A., Phys. Rev. B 42, 2393 (1990).
[4] Hoines, L.M., Ph.D. thesis, Michigan State University, 1994.
[5] Romano, A., VanHellemont, J., Bender, H., and Morante, J.R., Ultramicroscopy 31, 183 (1989).
[6] Shaapur, F. and Park, M., Mater. Res. Soc. Proc. 199, 177 (1990).
[7] Sinclair, R. and Konno, T.J., Mater. Res. Soc. Proc. 311, 3 (1993).
[8] Holloway, K., Sinclair, R., and Nathan, M., J. Vac. Sci. Tech. A7, 1479 (1989).
[9] Petford-Long, A.K., Steams, M.B., Chang, C.-H., Nutt, S.R., Steams, D.G., Ceglio, N.M., and Hawryluk, A.M., J. Appl. Phys. 61, 1422 (1987).
[10] Holloway, K., Do, K.B., and Sinclair, R., J. Appl. Phys. 65,474 (1989).
[11] Cheng, Y., Smith, D.J., Steams, M.B., and Steams, D.G., J. Appl. Phys. 72, 5165 (1992).

High-Resolution Transmission Electron Microscopy Study of Metallic Spin-Glass/Amorphous Silicon Multilayers

  • David A. Howell (a1), Martin A. Crimp (a1), Lilian M. Hoines (a2) and J. Bass (a2)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed