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Highly Oriented Co Soft Magnetic Films on Si Substrates

  • Heng Gong (a1), Wei Yang (a1), Maithri Rao (a2), David E. Laughlin (a2) and David N. Lambeth (a1)...

Abstract

Thin Co and Co based alloy films with the face centered cubic (FCC) structure have been epitaxially grown on single crystal Si wafers by sputter deposition. Epitaxial orientation relationships have been determined by x-ray diffraction, x-ray pole figure scans and TEM. Magnetic properties have been characterized using vibrating sampling magnetometer (VSM), torque magnetometer and BH loop tracer. Soft magnetic properties have been observed for the pure Co films.

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«1» Lambeth, D. N. et al., Mat. Rec. Soc. Symp. Proc., VoL 517, 181(1998).
«2» Gong, H., Rao, M., Laughlin, D. E., and Lambeth, D. N., J. AppL Phys. 85, 5750(1999).
«3» Gong, H., Rao, M., Laughlin, D. E., and Lambeth, D. N., J. AppL Phys. 85, 4699(1999).
«4» Yang, W., Lambeth, D. N., Tang, L., and Laughlin, D. E., J. AppL Phys. 81, 4370(1997).
«5» Yang, W., Lambeth, D. N., and Laughlin, D. E., J. Appl. Phys. 85, 4723(1999).
«6» For example, see Cullity, B. D. ‘Introduction to Magnetic Materials’ Page 221, Addison-Wesley Publishing Company, Inc. (1972).

Highly Oriented Co Soft Magnetic Films on Si Substrates

  • Heng Gong (a1), Wei Yang (a1), Maithri Rao (a2), David E. Laughlin (a2) and David N. Lambeth (a1)...

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