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High Resolution Plan View Imaging of Clean and Au Deposited Si(111) surfaces

Published online by Cambridge University Press:  22 February 2011

S. Ozawa ,
Y. Tanaka ,
K. Kobayashi ,
N. Yamamoto  and
K. Yagi
S. Ozawa
Affiliation:
Physics Department, TokyoInstitute of Technology, Oh-okayama, Meguro, Tokyo 152, Japan
Y. Tanaka
Affiliation:
Physics Department, TokyoInstitute of Technology, Oh-okayama, Meguro, Tokyo 152, Japan
K. Kobayashi
Affiliation:
Physics Department, TokyoInstitute of Technology, Oh-okayama, Meguro, Tokyo 152, Japan
N. Yamamoto
Affiliation:
Physics Department, TokyoInstitute of Technology, Oh-okayama, Meguro, Tokyo 152, Japan
K. Yagi
Affiliation:
Physics Department, TokyoInstitute of Technology, Oh-okayama, Meguro, Tokyo 152, Japan
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Abstract

High resolution plan view images of clean and Au deposited Si(111) surfaces are presented. Corner holes and small holes between dimers of the DAS model of the 7×7 structure were clearly resolved. In the case of the Si(111)5×1-Au structure the 5 times period fringes did not show fine details.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 208: Symposium J – Advances in Surface and Thin Film Diffraction , 1990 , 189
Copyright
Copyright © Materials Research Society 1991

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References

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