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Growth of Organic Periodic Structures by Molecular Layer Deposition

Published online by Cambridge University Press:  10 February 2011

T. Dietrich
Affiliation:
Nonlinear Optics Laboratory, Institute of Quantum Electronics, Swiss Federal Institute of Technology, CH-8093 Ztirich, Switzerland
R. Schlesser
Affiliation:
Nonlinear Optics Laboratory, Institute of Quantum Electronics, Swiss Federal Institute of Technology, CH-8093 Ztirich, Switzerland
Z. Sitar
Affiliation:
North Carolina State University, Materials Research Center, Raleigh, NC 27695–7919, USA
P. Günter
Affiliation:
Nonlinear Optics Laboratory, Institute of Quantum Electronics, Swiss Federal Institute of Technology, CH-8093 Ztirich, Switzerland
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Abstract

Thin films of organic nonlinear optical materials have become of increasing interest for potential electro-optic and nonlinear optical applications. Organic molecular layer deposition (OMLD) consists of an alternating evaporation of suitable difunctional monomers under UHV conditions and allows self-terminating monolayer growth and in-situ polymerization of periodic structures. Film stability is increased due to chemical bonding between the alternating layers. Moreover, in contrast to epitaxial growth techniques, the choice of interesting inorganic substrates is not limited by lattice-matching conditions. We have investigated the xperimental requirements for OMLD in detail, with pyromellitic acid dianhydride (PAD), terephthalic acid dichloride (TOC), and 4,4′-diamino-diphenylether (DDE) as prototype precursors. After optimization of material fluxes and growth temperatures, covalently bonded monolayers were formed via a self-terminating surface reaction while excessive material was desorbed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1. Mobus, M., Karl, N., and Kobayashi, T., J. Crystal Growth 116, p. 495 (1992).Google Scholar
2. Englund, C. D., Collins, G. E., Schuerlein, T. J., and Armstrong, N. R., Langmuir 10, p. 2748 (1994).Google Scholar
3. Haskal, E. I., So, F. F., Burrows, P. E., and Forrest, S. R., Appl. Phys. Lett. 60, p. 3223 (1992).Google Scholar
4. Schlesser, R., Dietrich, T., Sitar, Z., Gitmans, F., Ktindig, A., Eng, L., Mtinch, B., and Guinter, P., J. Appl. Phys. 78 (8), p. 4943, 1995.Google Scholar
5. Gotoh, T., Fukuda, S., and Yamashiki, T., Nonlinear Optics, Proceedings of the Fifth Toyota Conference on Nonlinear Optical Materials, Aichi-ken, Japan, 6–9 October 1991, edited by Miyata, S. (Elsevier Science, Amsterdam 1992), p. 219.Google Scholar
6. Moritani, Y., Kashino, S., Acta Cryst. C47, p. 461, (1990).Google Scholar
7. Yoshimura, T., Tatsura, S., Sotoyama, W., Appl. Phys. Lett. 59 (4), p. 482, 1991.Google Scholar
8. Kubono, A., Okui, N., Tanaka, K., Umemoto, S., Sakai, T., Thin solid films 199, p. 385, 1991.Google Scholar