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Grain Boundary Structure and Morphology in 30° <100> Tricrystal Films of Al

  • N. Thangaraj (a1) and U. Dahmen (a1)

Abstract

The structure and morphology of 30° <100> tilt grain boundaries in tricrystal films of Al have been investigated by conventional and high resolution electron microscopy. By inducing heteroepitaxial growth on single crystal (111) Si substrates, Al formed polycrystalline thin films made of grains in three symmetry-related (100) orientations. The grain boundaries were well-faceted and a number of symmetric and asymmetric tilt boundaries and triple junctions were observed. Their morphology, topology and preferred faceting was related to the 12mm two-dimensional point symmetry of the tricrystal.

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