Hostname: page-component-7bb8b95d7b-lvwk9 Total loading time: 0 Render date: 2024-09-25T14:06:20.689Z Has data issue: false hasContentIssue false

Formation of Niobium Carbides in High-Dose Carbon-Ion-Implanted and Annealed Niobium

Published online by Cambridge University Press:  25 February 2011

J. S. Huang*
Affiliation:
Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, CA 94551
Get access

Abstract

Polycrystalline niobium was implanted with 200-keV C+ ions to a total fluence of 7 × 1017 carbon ions per cm2 (C/cm2). Auger electron spectroscopy (AES) analysis showed that the carbon concentration varied from 5 to 50 at.% within a depth of about 4000 Å. Glancing-angle x-ray diffraction analysis (XRDA) and transmission electron microscopy (TEM) analysis indicated that no Nb2C phase was formed and that a buried fee NbC layer was formed in the region where carbon content exceeds about 40 at.%. The absence of Nb2C was attributed to its narrow range of solubility for carbon and the low diffusivity of carbon atoms. The possibility of the NbC precipitation by nucleation and growth or by a diffusionless martensitic transformation is discussed. When the implanted samples were annealed at 1273 K for 1 h, an orthorhombic Nb2C phase formed as spherical precipitates and the implanted carbon redistributed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Huang, J. S., Musket, R. G., and Wall, M. A., in Processing Characterization of Materials Using Ion Beams, Mater. Res. Soc. Proc, Vol. 128, edited by Rhen, L. E., Greene, J. E., and Smidt, F. A. (Materials Research Society, Pittsburgh, Pa., 1986), pp. 327332.Google Scholar
2 Ziegler, Z. F., Biersack, J. P., and Littmark, U., The Stopping and Range of Ions in Solids, Vol. 1 (Pergamon Press, New York, 1985).Google Scholar
3 Elliott, R. P., Trans. Am. Soc. Met. 53, 13 (1961).Google Scholar
4 Storms, E. K., The Refractory Carbides (Academic Press, New York, 1967).Google Scholar
5 Ono, K. and Moriyama, J., J. Less-Common Met. 79, 255 (1981).Google Scholar
6 Davis, L. E., MacDonald, N. C., Palmberg, P. W., Riach, G. E., and Weber, R. E., Handbook of Auger Electron Spectroscopy, 2nd ed. (Physical Electronics Industries, Eden Prairie, Minn., 1976).Google Scholar
7 Nat. Bur. Stand. (U.S.) Monogr. 25, 21 (1984).Google Scholar
8 Wong-Ng, W., McMurdie, H., Paretzkin, B. Hubbard, C., and Dragoo, A., JCPDG Grant-in-Aid Report (U.S. Bureau of Standards, Washington, D. C., 1986).Google Scholar
9 Rudy, E. and Brukl, C. E., J. Am. Ceram. Soc. 50, 265 (1967).Google Scholar
10 JCPDS Powder Diffraction Files, PDF 15-127 (U.S. Bureau of Standards, Washington, D. C, 1988).Google Scholar
11 Powers, R. W. and Dolyle, M. V., J. Appl. Phys. 30, 514 (1959).Google Scholar
12 Huber, E. J. et al. , J. Phys. Chem. 65, 1846 (1961).Google Scholar
13 Bain, E. C., Trans. AIME 70, 25 (1924).Google Scholar