Hostname: page-component-848d4c4894-mwx4w Total loading time: 0 Render date: 2024-06-20T06:26:44.274Z Has data issue: false hasContentIssue false

Ferroelectric nanocomposite with high dielectric constants

Published online by Cambridge University Press:  11 February 2011

Mai T.N. Pham*
Affiliation:
MESA+ Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands.
B.A. Boukamp
Affiliation:
MESA+ Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands.
H.J.M. Bouwmeester
Affiliation:
MESA+ Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands.
D.H.A. Blank
Affiliation:
MESA+ Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands.
*
Corresponding author: m.t.n.pham@ct.uwente.nl
Get access

Abstract

Composites between ferroelectric material and a dispersed metal phase are of great interest due to the improvement in dielectric properties for such applications as high capacitance capacitors, non-volatile memory, ect. Using a colloidal method, Pt particles with a size of 3–5 nm were dispersed homogeneously in a PZT (PbZr0.53Ti0.43O3) matrix. No unwanted reaction phase between PZT and Pt during sintering at 1150 °C could be detected by X-ray diffraction. Electrical properties were investigated by impedance spectroscopy measurement. The effective dielectric constant increased remarkably as a power function of Pt volume content and can be described by the percolation theory. At 25 vol.% of Pt the dielectric constant of the composite is 4 times larger than that of pure PZT. The temperature dependence of the electrical properties is also influenced by the metallic phase fraction.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Haertling, G. H., J. Am. Ceram. Soc. 82 [4], 797818 (1999).Google Scholar
2. Duan, N., ten Elshof, J. E., Verweij, H., App. Phys. Lett. 77 [20], 32633265 (2000).Google Scholar
3. MacLachlan, D.S., Balszkiewicz, M., J. Am. Ceram. Soc. 73 [8], 21872203 (1990).Google Scholar
4. Malliaris, A., Turner, D.T., J. App. Phys. 42 [2], 614618 (1971).Google Scholar
5. Van Rheenen, P. R., McKelvy, M.J., Sol. Stat. Com. 57 [11], 865868 (1986).Google Scholar
6. Boukamp, B. A., Solid State Ionics 18–19, 136140 (1986).Google Scholar
7. Boukamp, B. A., Solid State Ionics 20, 3144 (1986).Google Scholar
8. Dubrov, V. E., Zh. eskp. teor. Fiz. 70, 2014 (1976).Google Scholar
9. McLachlan, D. S., In “Electrically Based Microstructural Characterization”, Vol. 411 (North-Holland, New York, 1996) pp. 309320.Google Scholar
10. Taya, M., Hayashi, S., Kobayashi, A. S., J. Am. Ceram. Soc. 73, 13821391 (1990).Google Scholar
11. Las, W. C., Sapgnol, P. D., Ceramics International 27, 367372 (2001).Google Scholar