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Femtosecond Laser Melting of Graphite and Diamond

Published online by Cambridge University Press:  25 February 2011

D. H. Reitze ,
H. Ahn ,
X. Wang  and
M. C. Downer
D. H. Reitze
Affiliation:
Department of Physics, The University of Texas at Austin, Austin, TX 78712
H. Ahn
Affiliation:
Department of Physics, The University of Texas at Austin, Austin, TX 78712
X. Wang
Affiliation:
Department of Physics, The University of Texas at Austin, Austin, TX 78712
M. C. Downer
Affiliation:
Department of Physics, The University of Texas at Austin, Austin, TX 78712
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Abstract

Femtosecond time-resolved reflectivity measurements performed on highly oriented pyrolytic graphite (HOPG) and diamond elucidate the nature of the phase transition from solid to liquid carbon. In HOPG, we find that a high-reflectivity phase lasting as long as 10 ps appears when the surface is irradiated with pulse fluences in excess of 0.13 J/cm2, the critical fluence for melting. This transforms within 30 ps into an equilibrium low-reflectivity phase lasting hundreds of ps, similar to behavior observed in picosecond reflectivity experiments. The results suggest the occurrence of a two-step phase transition (graphite -> liquid metal -> liquid insulator) when HOPG is excited above the critical fluence. Similar results are obtained with diamond.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 157: Symposium A – Beam-Solid Interactions: Physical Phenomena , 1989 , 425
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1 Bundy, F.P., J. Chem. Phys. 38, 618 (1963).Google Scholar
2 Reitze, D. H., Wang, X., Ahn, H., and Downer, M. C., Phys. Rev. B 40, 11986 (1989).Google Scholar
3 Heremans, J., Olk, C.H., Eesley, G.L., Steinbeck, J., and Dresselhaus, G., Phys. Rev. Lett. 60, 452 (1988).Google Scholar
4 Steinbeck, J., Braunstein, G., Dresselhaus, M.S., Venkatesan, T., Jacobson, D.C., J. Appl. Phys. 58, 4374 (1985).Google Scholar
5 Venkatesan, T., Jacobson, D.C., Gibson, J.M., Elman, B.S., Braunstein, G., Dresselhaus, M.S., and Dresselhaus, G., Phys. Rev. Lett. 53, 360 (1984).Google Scholar
6 Malvezzi, A.M., Bloembergen, N., and Huang, C.Y., Phys. Rev. Lett. 57, 146 (1986).Google Scholar
7 Chauchard, E.A., Lee, Chi H., and Huang, C.Y., Appl. Phys. Lett. 50, 812 (1987).Google Scholar
8 Downer, M.C., Fork, R. L., and Shank, C.V., J. Opt. Soc. Am. B 2, 595 (1985).Google Scholar
9 Wood, W.M., Focht, Glenn, and Downer, M.C., Opt. Lett. 13, 984 (1988).Google Scholar
10 Taft, E.A. and Philipp, H.R., Phys. Rev. 138, 197 (1965).Google Scholar
11 Johnson, L.G. and Dresselhaus, G., Phys. Rev. B 7, 2275 (1973).Google Scholar
12 Seibert, K., Kurz, H., Malvezzi, A. M., Reitze, D. H., Dadap, J., Ahn, H., and Downer, M. C. (submitted to Phys. Rev. B).Google Scholar