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Fast X-ray Measurement System for Structural Study in Zr60Al15Ni25 Supercooled Liquid

Published online by Cambridge University Press:  10 February 2011

S. Sato
Affiliation:
Inoue Superliquid Glass Project, ERATO, 2–1-1 Yagiyama-minami, Sendai 982–0807, Japan
E. Matsubara
Affiliation:
Department of Materials Science and Engineering, Graduate School, Kyoto University, Kyoto 606–8317, Japan
Y Waseda
Affiliation:
Institute for Advanced Materials Processing, Tohoku University, Sendai 980–8577, Japan
T. Zhang
Affiliation:
Institute for Materials Research, Tohoku University, Sendai 980–8577,Japan
A. Inoue
Affiliation:
Institute for Materials Research, Tohoku University, Sendai 980–8577,Japan
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Abstract

A fast x-ray measurement system adopting the geometry of the Debye-Scherrer camera in combination with an imaging plate has been developed for the structural study of supercooled liquid. We carried out the anomalous x-ray scattering (AXS) measurement as well as the ordinary x-ray diffraction measurement with this system in Zr60Al15Ni25 supercooled liquid at 720K above the glass transition temperature (693K). A whole diffraction profile of very good counting statistics that even fits to the AXS analyses is obtained for a very short time (≅600s). The analyses of scattering data observed in the Zr60Al15Ni25 supercooled liquid for various annealing times in this system provide us information on a change of local atomic structures in the liquid state.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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