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Fabrication of V2O5 Thin Films and their Electrochemical Properties in Lithium Microbatteries

Published online by Cambridge University Press:  16 February 2011

C. Julien
Affiliation:
Laboratoire de Physique des Solides, associé au CNRS, Université Pierre et Marie Curie 4 place Jussieu, 75252 Paris Cedex 05, France
A. Gorenstein
Affiliation:
Laboratoire de Physique des Solides, associé au CNRS, Université Pierre et Marie Curie 4 place Jussieu, 75252 Paris Cedex 05, France
A. Khelfa
Affiliation:
Laboratoire de Physique des Solides, associé au CNRS, Université Pierre et Marie Curie 4 place Jussieu, 75252 Paris Cedex 05, France
J.P. Guesdon
Affiliation:
Laboratoire de Physique des Solides, associé au CNRS, Université Pierre et Marie Curie 4 place Jussieu, 75252 Paris Cedex 05, France
I. Ivanov
Affiliation:
Laboratoire de Physique des Solides, associé au CNRS, Université Pierre et Marie Curie 4 place Jussieu, 75252 Paris Cedex 05, France
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Abstract

Thin films of V2O5 were prepared using the flash-evaporation technique. Amorphous and polycrystalline samples were characterized by X-ray diffraction, Raman spectroscopy and XPS analysis. The electrical properties of the samples were determined. The effect of either deposition parameters or post-deposition treatments, i.e., annealing in various atmospheres and at different temperatures, on transport properties are presented.

Electrochemical characteristics are evaluated in V2O5/LiCIO4-PC/Li microbatteries. The discharge curves present several voltage plateaus, similar to those already observed in cells with bulk V2O5 cathodes. Kinetics of lithium intercalation have been investigated as a function of the growth conditions of V2O5 films. Chemical diffusion coefficient and enhancement factor are calculated as a function of the degree of lithium intercalation. All the results are compared with previous reported results for bulk vanadium oxides. The relationship between the crystallinity of the films and their electrochemical features is also discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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