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Fabrication of Diamond Nanopit arrays by Room-temperature Curing Nanoimprint Lithography Using Glass-like Carbon Molds

Published online by Cambridge University Press:  10 January 2012

Shuji Kiyohara ,
Chigaya Ito ,
Ippei Ishikawa ,
Hirofumi Takikawa ,
Yoshio Taguchi ,
Yoshinari Sugiyama ,
Yukiko Omata  and
Yuichi Kurashima
Shuji Kiyohara
Affiliation:
Electric and Control System Engineering Course, Faculty of Advanced Engineering, Maizuru National College of Technology, 234 Aza Shiroya, Maizuru, Kyoto 625-8511, Japan
Chigaya Ito
Affiliation:
Electric and Control System Engineering Course, Faculty of Advanced Engineering, Maizuru National College of Technology, 234 Aza Shiroya, Maizuru, Kyoto 625-8511, Japan
Ippei Ishikawa
Affiliation:
Electric and Control System Engineering Course, Faculty of Advanced Engineering, Maizuru National College of Technology, 234 Aza Shiroya, Maizuru, Kyoto 625-8511, Japan
Hirofumi Takikawa
Affiliation:
Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Toyohashi, Aichi 441-8580, Japan
Yoshio Taguchi
Affiliation:
Application and Technical Section, ELIONIX INC., 3-7-6 Motoyokoyama, Hachioji, Tokyo 192-0063, Japan
Yoshinari Sugiyama
Affiliation:
Application and Technical Section, ELIONIX INC., 3-7-6 Motoyokoyama, Hachioji, Tokyo 192-0063, Japan
Yukiko Omata
Affiliation:
Application and Technical Section, ELIONIX INC., 3-7-6 Motoyokoyama, Hachioji, Tokyo 192-0063, Japan
Yuichi Kurashima
Affiliation:
Department of Mechanical System Engineering, University of Yamanashi, 4-3-11 Takeda, Kofu, Yamanashi 400-8511, Japan
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Abstract

We have proposed the use of glass-like carbon (GC), as mold material because the 27-maximum etching selectivity of polysiloxane film against GC, which was approximately sixtimes larger than that of polysiloxane film against chemical vapor deposited (CVD) diamond film. We have investigated the fabrication of diamond nanopit arrays by room-temperature curing nanoimprint lithography (RTC-NIL) using GC mold, as applications to the emitter and the micro-gear. The polysiloxane has in the state of sticky liquid at room-temperature and negative-exposure characteristic. Therefore, the polysiloxane was used as RTC-imprint resist material, and also used as electron beam (EB) resist (oxide mask) material in EB lithography. We have fabricated the cylindrical GC nanodot mold with 500 nm-diameter, 600 nm-height and 2 μm-pitch. We carried out RTC-NIL using GC mold under the following optimum conditions: time from spin-coating to imprint of 1 min, imprinting pressure of 0.5 MPa and imprinting time of 5min. Then, we have processed the diamond film with an electron cyclotron resonance (ECR) oxygen ion shower. We have fabricated diamond nanopit array with 250 nm-depth and 500 nm-diameter. The diameter of diamond nanopit pattern was in good agreement with that of GC mold. Moreover, the depth of the diamond nanopit patterns fabricated by RTC-NIL using cylindrical GC mold was three times larger than that using conical diamond mold.

Keywords

diamondnanostructureion-beam processing
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1395: Symposium N – Diamond Electronics and Biotechnology–Fundamentals to Applications V , 2012 , mrsf11-1395-n12-02
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

1. Kim, K. D., Jeong, J. H., Park, S. H., Choi, D. G., Choi, J. H. and Lee, E. S., Microelectron. Eng. 86, 1983 (2009).Google Scholar
2. Youn, S. W., Takahashi, M., Goto, H., Maeda, R., J. Mater. Process. Technol. 187, 326 (2007).Google Scholar
3. Zhang, Y., Lu, J., Shimano, S., Zhou, H., Maeda, R., Electrochem. Commun. 9, 1365 (2007).Google Scholar
4. Youn, S. W., Ogiwara, M., Goto, H., Takahashi, M. and Maeda, R., J. Mater. Process. Technol. 202, 76 (2008).Google Scholar
5. Takazawa, N., Yamanoi, T., Iizuka, K., Hiraide, T., Yoshiawa, H., Ando, Y., Mita, M., Oi, H., Takahashi, M. and Yoshimoto, M., Diamond Relat. Mater. 20, 866 (2011) .Google Scholar
6. McClelland, G. M., Hart, M. W., Rettner, C. T., Best, M. E., Carter, K. R. and Terris, B. D., Appl. Phys. Lett. 81, 1483 (2002).Google Scholar
7. Kiyohara, S., Taguchi, Y. and Takikawa, H. et al. , in Diamond Nanopit Arrays Fabricated by Room-Temperature Nanoimprinting using Diamond Molds, edited by Nebel, C. E., Bergonzo, P. and Butle, J. E., (Mater. Res. Symp. Proc. 1282, Boston, MA, 2010) pp. 117-122.Google Scholar
8. Kiyohara, S., Kashiwagi, T., Takikawa, H., Kurashima, Y., Taguchi, Y. and Sugiyama, Y, e-J.Surface Sci. and Nanotech. 7, 772 (2009).Google Scholar