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Fabrication and Characterization of Color Phosphors Prepared Electrophoretically for 4-inch Full Color Fed Application

Published online by Cambridge University Press:  10 February 2011

J. P. Hong
Affiliation:
Materials and Devices Research Center, Samsung Advanced Institute of TechnologyP.O. Box 11, Suwon, Korea 440–600, jphong@saitgw.sait.samsung.co.kr
J. E. Jang
Affiliation:
Materials and Devices Research Center, Samsung Advanced Institute of TechnologyP.O. Box 11, Suwon, Korea 440–600, jphong@saitgw.sait.samsung.co.kr
Y. H. Jin
Affiliation:
Materials and Devices Research Center, Samsung Advanced Institute of TechnologyP.O. Box 11, Suwon, Korea 440–600, jphong@saitgw.sait.samsung.co.kr
J. W. Kim
Affiliation:
Materials and Devices Research Center, Samsung Advanced Institute of TechnologyP.O. Box 11, Suwon, Korea 440–600, jphong@saitgw.sait.samsung.co.kr
J. H. Choi
Affiliation:
Materials and Devices Research Center, Samsung Advanced Institute of TechnologyP.O. Box 11, Suwon, Korea 440–600, jphong@saitgw.sait.samsung.co.kr
Y. C. You
Affiliation:
Materials and Devices Research Center, Samsung Advanced Institute of TechnologyP.O. Box 11, Suwon, Korea 440–600, jphong@saitgw.sait.samsung.co.kr
N. S. Park
Affiliation:
Materials and Devices Research Center, Samsung Advanced Institute of TechnologyP.O. Box 11, Suwon, Korea 440–600, jphong@saitgw.sait.samsung.co.kr
J. M. Kim
Affiliation:
Materials and Devices Research Center, Samsung Advanced Institute of TechnologyP.O. Box 11, Suwon, Korea 440–600, jphong@saitgw.sait.samsung.co.kr
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Abstract

Color phosphors have been deposited on indium-tin glasses by utilizing an electrophoretic process for the application to prototype 4-inch full color FED devices. The deposition suspension is prepared with color phosphors of l-3um size, isopropanol, charger and binder. Various parameters, such as deposition time and applied voltages, are systematically performed to this end. As a result, each phosphor exhibited uniform thickness of about 6–10um over the whole plate. Electrical properties of the deposited phosphors are investigated and compared both in the vacuum chamber and in fully-sealed 4” FED conditions. In addition, they are extensively characterized by the SEM and 3-dimentional analysis. Experimental results confirm that the phosphor quality in real FED devices is significantly affected by deposition conditions.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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