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Emissivity of Silicon Carbide Composites as a Function of Temperature and Microstructure

Published online by Cambridge University Press:  10 February 2011

Ming Sun  and
Isabel K. Lloyd
Ming Sun
Affiliation:
Materials and Nuclear Engineering, University Of Maryland, College Park, MD, 20742-2115
Isabel K. Lloyd
Affiliation:
Materials and Nuclear Engineering, University Of Maryland, College Park, MD, 20742-2115
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Abstract

Spectral emissivity normal to the sample surface was investigated as a potential intelligent control parameter for the manufacture of SiC fiber reinforced SiC composites by chemical vapor infiltration (CVI) and microwave assisted CVI. Results indicated that at temperatures between 600 and 1000°C and wavelengths between 1500 and 2100 nm emissivity was sensitive to the sample porosity. It also appeared to be sensitive to the thickness of the oxide layer on the composites. The emissivity was not very sensitive to temperature in this region. It was concluded that emissivity is promising as a probe of density during manufacturing. It may also be useful as a probe of oxide layer formation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 410: Symposium S – Covalent Ceramics III-Science and Technology of Non-Oxides , 1995 , 411
Copyright
Copyright © Materials Research Society 1996

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References

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