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Electrostatic Force Microscopy of Nanofibers and Carbon Nanotubes: Quantitative Analysis Using Theory and Experiment

  • Sujit Sankar Datta (a1), Cristian Staii (a2), Nicholas J. Pinto (a3), Douglas R. Strachan (a4) and AT Charlie Johnson (a5)...

Abstract

Electrostatic force microscopy (EFM) is a widely used scanning-probe technique for the characterization of electronic properties of nanoscale samples without the use of electrical contacts. Here we review the basic principles of EFM, developing a quantitative framework by which EFM measurements of extended nanostructures can be understood. We support our calculations with experimental data of EFM of carbon nanotubes and conducting or insulating electrospun polyaniline-based nanofibers. Furthermore, we explore routes towards extending EFM as a means of non-invasively probing the local electronic density of states of carbon nanotubes.

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Keywords

Electrostatic Force Microscopy of Nanofibers and Carbon Nanotubes: Quantitative Analysis Using Theory and Experiment

  • Sujit Sankar Datta (a1), Cristian Staii (a2), Nicholas J. Pinto (a3), Douglas R. Strachan (a4) and AT Charlie Johnson (a5)...

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