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Electron Microscopy and Analysis at Higher Voltages: The Philips EM430 300kV Microscope
Published online by Cambridge University Press: 21 February 2011
Extract
The past decade has seen the evolution of the Philips TEM from a “microscope”to an integrated microanalytical system. A current example of this trend is the EM 420*, an instrument whose design concepts are reflected in the most recently offered TEM, the compact, high kV, high resolution EM430.
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- Copyright © Materials Research Society 2006