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Electron Microscopy and Analysis at Higher Voltages: The Philips EM430 300kV Microscope

Published online by Cambridge University Press:  21 February 2011

Peter N. Hagemann  and
John S. Fahy
Peter N. Hagemann
Affiliation:
Electron Optics Laboratory, Philips Scientific and Industrial Equipment Division, N.V.Philips' Gloeilampenfabrieken, Eindhoven,The Netherlands.
John S. Fahy
Affiliation:
Product Manager, Electron Optics, Philips Electronic Instruments, Inc., Mahwah, N.J.
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Extract

The past decade has seen the evolution of the Philips TEM from a “microscope”to an integrated microanalytical system. A current example of this trend is the EM 420*, an instrument whose design concepts are reflected in the most recently offered TEM, the compact, high kV, high resolution EM430.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 31: Symposium N – Electron Microscopy of Materials , 1983 , 71
Copyright
Copyright © Materials Research Society 2006

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References

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